Instrumentation and Techniques
Advances in EELS and EFTEM
Abstract
EELS and EFTEM of Surface Plasmons in Metallic Nanostructures
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 762-763
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Mapping of Electron-Beam-Excited Plasmon Modes in Lithographically-Defined Gold Nanostructures
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- 09 April 2017, pp. 764-765
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Fabry-Perot Plasmonic Resonances in Silver Nanowire Antennas Imaged with a Sub-Nanometer Electron Probe
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- 08 April 2017, pp. 766-767
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Low-Loss Studies on Metallic and Insulating Nanostructures Using a Monochromatic Electron Beam
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- 08 April 2017, pp. 768-769
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Contrast Generation and Three-Dimensional Characterization of Organic Photovoltaic Device Structures via Low-Loss Energy-Filtered TEM
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- 09 April 2017, pp. 770-771
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Simulation of valence EELS and Optical Response Functions from First Principles
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- 08 April 2017, pp. 772-773
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Extrapolating the Valence Spectral Limit in EELS
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- 08 April 2017, pp. 774-775
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EELS Studies of Extrinsic Multiferroics
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- 08 April 2017, pp. 776-777
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Electron Energy Loss Spectroscopy for Aqueous in Situ Scanning Transmission Electron Microscopy
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 778-779
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Energy-Loss Characteristics for EFTEM Imaging with a Liquid Flow Cell
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 780-781
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Analysis and Artifacts in EELS Spectrum Imaging
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 782-783
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Multivariate Statistical Analysis Strategies of EELS Spectral Images
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 784-785
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Applications of Atomic-Resolution EELS Mapping at Low kV
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 786-787
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HAADF and EELS Combined Studies of a New Generation of Materials for Ni-MH Batteries
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- 08 April 2017, pp. 788-789
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Development of a New Acquisition Scheme for Energy-Filtering Transmission Electron Microscopy Spectrum-Imaging toward Quantification
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- 08 April 2017, pp. 790-791
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Cornell Spectrum Imager: Open Source Spectrum Analysis with ImageJ
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 792-793
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High-Spatial and High-Energy Resolution EELS Studies of Chemical and Electronic Properties of Interfaces and Nanostructures
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- 09 April 2017, pp. 794-795
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Aberration Corrected STEM-EELS: Applications to Magnetic Materials
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 796-797
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In-Situ Study of Nb Oxide Thin Films Using Electron Energy Loss Spectroscopy
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 798-799
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Energy Loss Near-Edge Fine Structure of Oxygen K of Spinel NixMn3-xO4
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- Published online by Cambridge University Press:
- 09 April 2017, pp. 800-801
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