Instrumentation and Techniques
Advancing Data Collection and Analysis for Atom Probe Tomography
Abstract
A Lattice-Rectified and Detection Efficiency Compensated APT Reconstruction
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- 08 April 2017, pp. 722-723
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Toward Automated Optimization of Reconstruction of Atom Probe Data
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- 08 April 2017, pp. 724-725
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Estimation of Specimen Lensing in Atom Probe Tomography
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- 08 April 2017, pp. 726-727
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Analytic Hitmap Equation of the Ideal Spherical Evaporator
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- 08 April 2017, pp. 728-729
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Importance of the Protective Layers and the Specimen Preparation for Reproducible APT Results
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- 08 April 2017, pp. 730-731
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Application of Atom Probe Tomography in Understanding Thin Film Chemical Ordering and Stress Behavior
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- 08 April 2017, pp. 732-733
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Resolving Nanostructures in Complex Penetrative Oxidation for Ni-30Cr Alloys Exposed to High-Temperature Water using APT and TEM
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- 08 April 2017, pp. 734-735
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Transmission Electron Microscopy and Atom Probe Tomography Analysis of Rare-Earth Hexaboride Nanowires
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- 08 April 2017, pp. 736-737
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Complimentary Chemical Imaging of Au-Nanoparticles Embedded in MgO using Laser Assisted Atom Probe Tomography
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- 09 April 2017, pp. 738-739
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Non-Tangential Continuity Reconstruction in Atom Probe Tomography Data
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- 08 April 2017, pp. 740-741
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Analysis of Laser Influence on Field Enhancement and Heating of the Specimen in Pulsed Laser Atom Probe Tomography
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- 08 April 2017, pp. 742-743
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Analysis of Ion Evaporation Events through Data Mining: an Experimental Foundation for Interpreting Chemical Imaging in the Atomscope
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- 08 April 2017, pp. 744-745
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Kinetic-Energy Discrimination for Atom Probe Tomography: Concepts and Potential Detectors
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- 08 April 2017, pp. 746-747
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Characterization of the Chemistry and Structure of Material Transfer on AFM Tips Resulting from Contact and Sliding Experiments
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- 08 April 2017, pp. 748-749
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Atom Probe Tomography Analysis of Thick Film SiO2 and Oxide Interfaces: Conditions Leading to Improved Analysis Yield
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- 08 April 2017, pp. 750-751
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Prospects for Atom Probe Tomography of Commercial Semiconductor Devices
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- 08 April 2017, pp. 752-753
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MeasuringContributions to Mass Resolving Power in Atom Probe Tomography
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- 08 April 2017, pp. 754-755
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New Equipment for Correlative FIB/TEM/Atom Probe and Site-Specific Preparation Using STEM Live Imaging
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- 08 April 2017, pp. 756-757
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TEM and Atom Probe Investigation of Calcium Carbonate Precipitation in Seawater
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- 08 April 2017, pp. 758-759
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Embedded Nanoparticle Analysis using Atom Probe Tomography and High-Resolution Electron Microscopy
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- 08 April 2017, pp. 760-761
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