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Volume 17 - Supplement S2 - July 2011

Contents

Page 18 of 49

Instrumentation and Techniques

Focused Ion Beam

Abstract

  • Characterization of Semiconductor Nanospikes Produced by Focused Ion Beam Erosion

  • K Grossklaus, J Millunchick
  • Published online by Cambridge University Press:
    08 April 2017, pp. 682-683
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • The Focused Ion Beam Hard Mask Mechanism

  • W McKenzie, P Munroe
  • Published online by Cambridge University Press:
    08 April 2017, pp. 684-685
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Development of a Cryo-Air Protection Holder for FIB/(S)TEM

  • Y Kuroda, M Kudo, A Morikawa, T Sato, T Iwahori, T Agemura
  • Published online by Cambridge University Press:
    08 April 2017, pp. 688-689
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • A New Method to Fabricate 3D Electron Tomography Sample Using FIB Technique

  • X Wang, R Lockwood, D Vick, A Meldrum, M Malac
  • Published online by Cambridge University Press:
    08 April 2017, pp. 690-691
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Three Dimensional Characterization of Cells in Hydrogel with Focused Ion Beam

  • A Al-Abboodi, J Fu, P Chan, P Doran
  • Published online by Cambridge University Press:
    08 April 2017, pp. 692-693
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Preparation of 2-D Sections of Li-ion Battery Electrode Architectures with a Focused Ion Beam and Modeling

  • E Gorzkowski, D Rowenhorst, D Stephenson, D Wheeler
  • Published online by Cambridge University Press:
    08 April 2017, pp. 694-695
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • FIB TEM Sample Preparation of Deeply Buried Interfaces

  • M Rye, J Michael, N Yang
  • Published online by Cambridge University Press:
    08 April 2017, pp. 696-697
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Effect of Ion Currents on the Morphology of Focused Ion Beam Milled Patterns on a Single Crystalline Diamond

  • W Lee, R Golnabi, A Calabro, C Queenan, D Becker, D Kim
  • Published online by Cambridge University Press:
    09 April 2017, pp. 698-699
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • The Study of the FIB Induced Damage in Diamond

  • S Rubanov, A Suvorova
  • Published online by Cambridge University Press:
    08 April 2017, pp. 700-701
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Significance of Outer Keratin Cortices to Structural Color Production in Feathers Revealed through Focused Ion Beam Milling and Microspectrometry

  • M Shawkey, N Avishai, A Avishai
  • Published online by Cambridge University Press:
    08 April 2017, pp. 702-703
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Effect of an Electric Field within Microscope Monohaz FIB between a Micro Manipulator Sharp and the Ion Trap of the Electron Detector

  • J Gómez, A Hernandez, A Duarte
  • Published online by Cambridge University Press:
    08 April 2017, pp. 704-705
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Advancing Data Collection and Analysis for Atom Probe Tomography

Abstract

  • Metrics for Characterization of Atom Probe Instrument Performance

  • I Anderson, E Steel, K Henry
  • Published online by Cambridge University Press:
    08 April 2017, pp. 706-707
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Toward Atomic-Scale Tomography: The ATOM Project

  • T Kelly, M Miller, K Rajan, S Ringer, A Borisevich, N Dellby, O Krivanek
  • Published online by Cambridge University Press:
    08 April 2017, pp. 708-709
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Development of Atom Probe Tomography with In-situ STEM Imaging and Diffraction

  • B Gorman, J Shepard, R Kirchhofer, J Olson, T Kelly
  • Published online by Cambridge University Press:
    09 April 2017, pp. 710-711
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • First Principles Modeling Studies of Field Evaporation:Preliminary Studies Relevant to the Atomscope

  • J Peralta, M Miller, S Ringer, T Kelly, S Ringer, K Rajan
  • Published online by Cambridge University Press:
    08 April 2017, pp. 712-713
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Improved Yield and Data Quality in Atom Probe Tomography

  • R Ulfig, E Oltman, D Lenz, T Payne, T Prosa, D Larson
  • Published online by Cambridge University Press:
    08 April 2017, pp. 714-715
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Atom Probe Tomography of Engineered Nanostructures with Complex Field Evaporation Behavior

  • K Henry, A Herzing, I Anderson
  • Published online by Cambridge University Press:
    08 April 2017, pp. 716-717
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Atom Probe Tomography of Interfaces at the Near-Lattice Level

  • P Felfer, S Ringer, J Cairney
  • Published online by Cambridge University Press:
    08 April 2017, pp. 718-719
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Phase Composition at the Atomic-Size Scale through Multivariate Statistical Analysis of Atom Probe Tomography Data

  • M Keenan, V Smentkowski, R Ulfig, E Oltman, D Larson, T Kelly
  • Published online by Cambridge University Press:
    08 April 2017, pp. 720-721
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Page 18 of 49