Instrumentation and Techniques
Focused Ion Beam
Abstract
On-Probe Thinning of Samples for Bulk or STEM Type EDS Analysis
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 642-643
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Cryo-FIB Machining: An Alternative to TEM Cryo-Sections Cut with Diamonds?
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- 08 April 2017, pp. 644-645
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TEM Specimen Preparation with Plasma FIB Xe+ Ions
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- Published online by Cambridge University Press:
- 09 April 2017, pp. 646-647
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Large Volume High Resolution FIB Nanotomography
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- 08 April 2017, pp. 648-649
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Hyperion Plasma FIB for Precision 3D TSV Analysis
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- 08 April 2017, pp. 650-651
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A Comparison of Xenon Plasma FIB Technology with Conventional Gallium LMIS FIB: Imaging, Milling, and Gas-Assisted Applications
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- 08 April 2017, pp. 652-653
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An Aberration Corrected FIB for Nano-Area Mass Spectrometry
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- 08 April 2017, pp. 654-655
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Direct Imaging of Microstructural Changes in Si Induced by FIB-Patterning with Si++ and Ga+ Ions
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- 08 April 2017, pp. 656-657
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Efficient Target Preparation by Combined Pulsed Laser Ablation and FIB Milling
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- 08 April 2017, pp. 658-659
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Contrast Performance: Low Voltage Electrons vs. Helium Ions
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- 08 April 2017, pp. 660-661
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MeV Helium Ion Imaging of Gold Nanoparticles in Whole Cells
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 662-663
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A Closer Look at the Brain in 3D Using FIB-SEM
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 664-665
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Serial Sectioning in SEM: Challenges and Opportunities
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 666-667
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Application of Cryo FIB SEM for Nano-EHS Studies
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 668-669
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Characterizing the Microstructure of Corrosion Films Formed on Zircaloy-4 Using Focused Ion Beam (FIB) Serial Sectioning and 3-D Reconstruction
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- 08 April 2017, pp. 670-671
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Focused Ion Beam Circuit Edit–A Look into the Past, Present, and Future
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 672-673
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Experimental Observations on FIB Milling using a Custom Software Interface
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- 08 April 2017, pp. 674-675
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Aspects of Beam Control for Single and Dual Beam Systems
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- Published online by Cambridge University Press:
- 09 April 2017, pp. 676-677
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Site Specific Focused Ion Beam (FIB) Sample Preparation of Penetrative Oxidation in Ni-Base Alloys for 3DAPT Analysis
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 678-679
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The Effect of Crystallinity on Materials Removal Rate of Polyolefins During Ga+ Focused Ion Beam Nanomachining
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- 09 April 2017, pp. 680-681
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