Instrumentation and Techniques
Microanalysis at 60 Years: A Symposium Dedicated to Raimond Castaing
Abstract
Raymond Castaing's Ion Microscope and Secondary Ion Mass Spectrometry
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- Published online by Cambridge University Press:
- 08 April 2017, pp. 562-563
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Automated Classification of SIMS Images Using K-means Clustering
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- 08 April 2017, pp. 564-565
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Trace Element Micro-Analytical Imaging via Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS)
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- 09 April 2017, pp. 566-567
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Carbonaceous Materials Original to Impact Plume Condensates in a 3.24 Ga Impact-Derived Spherule Deposit, Barberton Greenstone Belt, South Africa
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- 08 April 2017, pp. 568-569
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Back-scattered Electron Tomography and X-Ray Microanalysis of Zirconolite in Lunar Granite 12032,366-19
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- 08 April 2017, pp. 570-571
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Quantifying Crystallographic Information from Electron Diffraction Patterns in the TEM
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- 09 April 2017, pp. 572-573
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Using Electron Backscatter Diffraction to Aid Identification of Fossilized Dinosaur Eggshells
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- 08 April 2017, pp. 574-575
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Addressing Accurate Trace Element Analysis at High Spatial Resolution in EPMA
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- 08 April 2017, pp. 576-577
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Challenges in Electron Probe Micronalysis 60 Years after Castaing: Examples from Complex Uranium and Rare Earth Element Minerals from Northern Australian Ore Deposits
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- 08 April 2017, pp. 578-579
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Improving EPMA Analyses Using Mean Atomic Number Backgrounds
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- 08 April 2017, pp. 580-581
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Advances in Electron-probe Microanalysis and Problem-Solving Approaches Using Microanalysis Tools
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- 08 April 2017, pp. 582-583
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Historical Development of the Cameca EPMA
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- 08 April 2017, pp. 584-585
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50 Years of JEOL Electron Probe Micro Analyzer
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- 09 April 2017, pp. 586-587
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Beam Sensitivity in EPMA: The Analysis of Apatite, Ca5(PO4)3(F,Cl,OH)
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- 08 April 2017, pp. 588-589
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On the Performance of XEDS and EELS in the AEM: 25 Years Later
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- 08 April 2017, pp. 590-591
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X-Ray Microanalysis of Boron Compounds: Approaches to Measuring Low-Z Materials
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- 08 April 2017, pp. 592-593
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Multivariate Statistical Analysis of STEM-EDS at the Noise Floor
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- 08 April 2017, pp. 594-595
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High Resolution Imaging and X-Ray Microanalysis in the FE-SEM
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- 08 April 2017, pp. 596-597
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Chemical Mapping at the Atomic Level using Energy Dispersive X-ray Spectroscopy
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- 08 April 2017, pp. 598-599
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Advanced Elemental Analysis with ED-EPMA, WD-EPMA and µ-XRF at a SEM
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- 08 April 2017, pp. 600-601
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