Biological Applications
Other
Interface between Adjacent UV-Treated or Detergent-Treated Vaccinia virus Particles
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- 30 December 2005, pp. 86-89
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AFM In-Situ Characterization of Supported Phospholipid Layers Formed by Vesicle Fusion
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- 30 December 2005, pp. 90-93
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Materials Applications
Other
Characterization of Ultrathin Films of Cellulose Esters
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- 30 December 2005, pp. 94-97
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Combining Nanoindentation with Atomic Force Microscopy to Characterize the Mechanical Properties of each Microconstituent of Low Carbon Steel
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- 30 December 2005, pp. 98-101
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Characterization of Thin Films Using Different Scanning Probe Microscopy (SPM) Modes
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- 30 December 2005, pp. 102-105
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Fabrication of Selective Metal Contacts on Single-Walled Carbon Nanotubes for Device Applications
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- 30 December 2005, pp. 106-109
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Atomic Force Microscopy Applied to the Study of Dewetting Patterns of Thin Films from Polymer Solutions
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- 30 December 2005, pp. 110-113
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Atomic Force Microscopy (AFM) Studies of Cured Self-Assembled Films for Chemical Sensor Applications
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- 30 December 2005, pp. 114-117
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Morphology Dependence on Fluorine Doped Tin Oxide Film Thickness Studied with Atomic Force Microscopy
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- 30 December 2005, pp. 118-121
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Characterization of PMMA/PVB Blend Films by Means of AFM
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- 30 December 2005, pp. 122-125
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Morphological and Electrical Characterization of Ti and Zr Sputter-Deposited Thin Films
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- 30 December 2005, pp. 126-129
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Adhesion Forces for Mica and Silicon Oxide Surfaces Studied by Atomic Force Spectroscopy (AFS)
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- 30 December 2005, pp. 130-133
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Local Stiffness in Nylon 6/Rubber Blends Determined by Digital Pulsed Force Mode-SPM
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- 30 December 2005, pp. 134-137
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Mechanical Measurements of Multilayer Thin Films Obtained by a PAPVD System
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- 30 December 2005, pp. 138-141
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The Effect of -Cyclodextrin Inclusion on the Morphology of [Ru(bpy)2Cl(BPEB)](PF6) Films by Scanning Force Microscopy
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- 30 December 2005, pp. 142-145
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Characterization by Atomic Force Microscopy of Electrodeposited Films of Polypyrrole Dinitrobenzoyl-derivative
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- 30 December 2005, pp. 146-149
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Grains and Sub Grains Identification in AISI 430 Stainless Steel with Atomic and Magnetic Force Microscopies
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- 30 December 2005, pp. 150-153
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AFM Studies of Ni Electrodeposits on GaAs
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- 30 December 2005, pp. 154-157
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Silver Nanoparticles Self Assembled on HOPG: Unusual Behavior as Probed by Scanning Tunneling Microscopy
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- 30 December 2005, pp. 158-161
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Surface Modification of a-C:H(N) Thin Films by Plasma Treatment
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- 30 December 2005, pp. 162-165
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