Microscopy and Microanalysis: Volume 9 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 9 - Issue S02 - August 2003

Abstract

In Situ Observations Using Ultrahigh Vacuum Scanning Electron Microscopy

An Environmental Transmission Electron Microscope for In-Situ Observation of Chemical Processes at the Nanometer Level

In-situ Growth of BN Nanocages

Dynamic Experiments in Low Vacuum & ESEM: New Perspectives in Cryo- Electron Microscopy

Valence Electron Energy-Loss Spectroscopy as a Tool for In Situ Diagnostics of Materials Properties

Effect of Ex-Situ Steam Treatment on Amorphous Carbon Film with Au Islands

High Temperature In-Situ Electron Microscopy Using A Dedicated Scanning Transmission Electron Micrscope

Aberration-Corrected STEM for Elemental Mapping

Sub-Ångstrom Resolution through Aberration-Corrected STEM

First results from the UK superSTEM Laboratory

Current and Future Developments in order to Approach a Point Resolution of dpr ~ 0.5 Å with a TEM

HRTEM Imaging of Weakly Scattering Atom Columns Using a Negative Spherical Aberration Combined with an Overfocus

Study of a Σ13 SrTiO3 grain boundary : Comparison between HREM, Exit Wave Reconstruction and Z-contrast analysis

HRTEM at Half-Ångstrom Resolution: from OÅM to TEAM

State of the first aberration-corrected, monochromized 200kV FEG-TEM

Ultimate Resolution Limit for ADF-STEM

Super-resolution imaging of nanostructures by solving the phase problem with over-sampling of diffraction patterns

Aberration Corrected Wien Filter as a Monochromator of High Spatial and High Energy Resolution Electron Microscopes

New Detection Principles on the GEMINI SUPRA FE-SEM

Benefits of a New Annular Darkfield Method Using Köhler Illumination in a Energy Filtering TEM

Microscopy and Microanalysis

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Volume 9 - Issue S02 - August 2003

Abstract