Microscopy and Microanalysis: Volume 9 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 9 - Issue S02 - August 2003

Abstract

FIB Dual-Beam Sample Preparation for TEM Observation

Focused Ion Beam Preparation Techniques for EFTEM Analysis

In-Situ Low Energy Ion Milling with a FIB-SEM for TEM lift-out Sample Preparation of Copper Damascene Structures Fabricated with Low k porous SiLKTM Semiconductor Dielectric

FIB-TEM Characterization Of Surface And Sub-Surface Defects Introduced Into Lithium Niobate By A Femtosecond Laser

Localised Charging Effects Induced In Nonconductive Materials During Focused Ion Beam Milling

Application of FIB to Metal Alloy TEM Sample Preparation

Advances in Broad Ion Beam Processing for 3D Microscopy and Microanalysis of Ceramic Composites

Surface Damage In Silicon After 30 Kev Ga Fib Fabrication

Applications of Focused Ion Beam Using FEI DualBeam DB235: How Deep Is How Small a Hole? & How to Drill It Deeper & Smaller?

Preparation of Transmission Electron Microscope Specimens from Ultra-Fine Fibers by a FIB Technique

Grazing Incidence X-ray Optics for Wavelength Dispersive Spectrometers in Micro-Analysis

Performance of a high count rate silicon drift x-ray detector on the anl 300 kv advanced analytical electron microscope.

A New High Energy-resolution Soft-X-ray Spectrometer for A Transmission Electron Microscope

The Right Tool For Low Energy X-Ray Microanalysis

Correlating Deformation Mechanisms with Mechanical Properties in Freestanding Thin Metallic Films

In-Situ Nanoindentation – A Unique Probe Of Deformation Response In Materials

Sealed Environmental Cell Microscopy

In-Situ Video-STM Studies of the Quasi-Collective Motion of Nanoscale Metal Strings in Au(100) Electrode Surfaces

Growth and Stability of Bi films on Si(111) studied by LEEM

Direct Measurement of Atom Diffusion Using Atom-Tracking STM

Microscopy and Microanalysis

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Volume 9 - Issue S02 - August 2003

Abstract