Microscopy and Microanalysis: Volume 9 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 9 - Issue S02 - August 2003

Abstract

The Effect of Oxygen on the Electronic Structure of MgB2

Improving Energy Resolution of EELS Spectra by Deconvolution using Maximum-Entropy and Richardson-Lucy Algorithms

Comparative Electron Energy-Loss Near-Edge Fine Structure Investigations Of Titanium Oxides

High Resolution Spectrometer Coupling to the Sub-Å IBM STEM

Determination of U-oxidation states in the brannerite structure by electron energy-loss (EELS), x-ray photoelectron (XPS) and diffuse reflectance (DRS) spectroscopies.

Design and First Results of SESAM

The Oxygen K edge in Strontium Titanate and Lanthanum Titanate

Investigation of Local Electronic, Dielectric and Optical Properties of Individual Composite Tabular AgX Emulsion Microcrystals by Cryo-EELS and LMTOASA Techniques

Experiencies and Possibilities with a 200 kV Monochromated (S)TEM

Relative contrast in a-Si and c-Si in ADF-STEM imaging

Insights into Degradation Mechanisms and Vacancy Ordering in BaTiO3

Atomic-Resolution EELS in Aberration-Corrected STEM

EELS Characterization of Tin Oxides

Identification of Microphases: New Databases for Electron Diffraction

The Nature of Precession Electron Diffraction Data

Strain Analysis of InxGa(1-x)N/GaN Films by CBIM Toward Quantification

Phase Identification by Selected Area Electron Diffraction

Sucrose Is A Good Alternative Sustain To Protect Protein Structure For Electron Crystallography

Strain Measurements at a NiSi/Si Interface Using STEM-CBED: A Quantifaction Method for Stress Relaxation During TEM Lamella Preparation

Transmission Electron Microscopy Study of a New Compound in the System Sm-Mn-Ge-O

Microscopy and Microanalysis

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Volume 9 - Issue S02 - August 2003

Abstract