Microscopy and Microanalysis: Volume 9 - Issue S02

Only show content I have access to (790)

Over 3 years (796)

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 9 - Issue S02 - August 2003

Abstract

Calibration of Image Analysis Systems for Statistically Demanding QM Applications

Characterization of Zeolite-supported Pt Catalysts by Image Analysis

Image Analysis Effects using Image Compression

Automatic Classification of the Shape of Graphite Particles in Cast Iron

Morphological and Morphometrical Characteristics of Particulate Solids To Recycle Resulting from Electric Cables Crio-comminution.

Quantitative Characterization of Particle Rotations During Plastic Deformation of Two Wrought Aluminum Alloys

Information Transfer Capability and Signal Processing Performance of Modern Scanning Electron Microscopes

Image Processing and Analysis in HRTEM

RIMAPS Characterization of Etch Pits on Deformed Aluminum Surfaces

Which atoms are where? Which fields are around?

Problems Concerning Application of Electron-Holography Observation of P-N Junctions from the Viewpoint of the Semiconductor Industry

Observing a p-n Junction in a Reverse-Biased GaP Light-Emitting Diode by Combining Electron Holography and Focused-Ion-Beam Milling

Is It Feasible To Routinely Check The Dopant Profiling Via Off-Axis Electron Holography For An IC Failure Analysis Laboratory?

Issues Affecting Quantitative Evaluation of Dopant Profiles Using Electron Holography

Electron Holography and Micromagnetic Simulations for TEM Magnetization Mapping

Lorentz Phase Imaging and In-situ Lorentz Microscopy of Patterned Co-Arrays.

Electron Holographic and Lorentz Microscopic Images of Variously Shaped Magnetic Specimens

Measurement of Charge at Grain-boundary Edge Dislocations in Ca-doped and Undoped YBCO by Electron Holography

Exit-Surface Dependency of Defocus measured by Off-axis Electron Holography

Interference of Inelastically Scattered Electrons by DBI/H Experiments

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 9 - Issue S02 - August 2003

Abstract