Abstract
X-Ray Determination of Retained Austenite in Steel Using ASTM E975
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- Published online by Cambridge University Press:
- 01 August 2003, pp. 710-711
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Magnification Standards for SEM, Light, or Scanning Probe Microscopy
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- Published online by Cambridge University Press:
- 01 August 2003, pp. 712-713
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NIST Certification of Metallurgical Standard Reference Materials for Microanalysis - A Short History
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- 01 August 2003, pp. 714-715
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A Metrology Approach to Uncertainty in Quantitative EDS Analyses
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- 01 August 2003, pp. 716-717
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Accurate Calibration of Microscope Magnification Standard
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- 01 August 2003, pp. 718-719
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Microstructure of Ultrasonic Welded Aluminum By Orientation Imaging Microscopy
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- 19 July 2003, pp. 720-721
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The Effects of EBSD Collection Speed on Indexing Accuracy
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- 19 July 2003, pp. 722-723
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Artifacts Introduced Through the Hough Transform in EBSD
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- 19 July 2003, pp. 724-725
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Diffraction Based Measurement of Surface Machining Damage in Superalloys
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- 19 July 2003, pp. 726-727
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Microstructural Evaluation in an Instant
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- 21 July 2003, pp. 728-729
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The Preparation of Metals and Alloys for Backscatter Electron Imaging
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- 21 July 2003, pp. 730-731
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Estimation of Prior-Austenite Grain Size in Heat Treated Martensitic Carbon and Low Alloy Steels
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- 21 July 2003, pp. 732-733
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Preparation of Porous Materials for Backscatter Electron Imaging: Some Observations on Metallurgical Grade Coke
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- 21 July 2003, pp. 734-735
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Stereological Analysis of Polycrystalline Microstructure
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- 21 July 2003, pp. 736-737
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Particle Analysis Using Neural Networks And Image Processing In The SEM
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- 21 July 2003, pp. 738-739
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Microstructural and Fractographic Analysis on Samples of Fractured Bolts
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- 21 July 2003, pp. 740-741
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Influence Of Austempering Temperature On Microstructure And Fracture Toughness Of A Spherodized Graphite Cast Steel
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- 21 July 2003, pp. 742-743
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Effect of the sensitization in stainless steel UNS S30400
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- 01 August 2003, pp. 744-745
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3D Display and Analysis of Strain Fields at Heterointerfaces
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- 21 July 2003, pp. 746-747
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Quantitative Image Analysis
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- 21 July 2003, pp. 748-749
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