Proceedings of Microscopy & Microanalysis 2017
Analytical and Instrumentation Science Symposia
Anniversary Session: Celebrating 50 Years of Microanalysis
Abstract
Micro X-ray Fluorescence: A personal perspective of 30 years
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- 04 August 2017, pp. 1006-1007
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Determination of Major, Minor, and Trace Elements in Jadeite using Scanning micro-X-ray Fluorescence
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- 04 August 2017, pp. 1008-1009
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Five Dimensional X-ray Imaging with the Color X-ray Camera
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- 04 August 2017, pp. 1010-1011
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Considerations for the Acquisition of Very Large Area EDS Spectral Image Mosaics
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- 04 August 2017, pp. 1012-1013
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Progress in X-ray Mapping in Electron Microscopes Toward Single-Atom Analysis
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- 04 August 2017, pp. 1014-1015
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Historical Development of the CAMECA EPMA
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- 04 August 2017, pp. 1016-1017
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History of JEOL Microbeam Analysis: High Accuracy Analyses for Scientific and Industrial Work from the Centimeter to Nanometer Scale
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- 04 August 2017, pp. 1018-1019
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EDAX - More Than 50 Years of Influence On Microanalysis
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- 04 August 2017, pp. 1020-1021
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50 Years of Microanalysis: A Little History of Who’s Who, A Perspective from Bruker
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- 04 August 2017, pp. 1022-1023
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The Magic That Turns a Tiny Cloud Of Electrons Into An X-Ray Spectrum
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- 04 August 2017, pp. 1024-1025
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SEM/EDS Trace Analysis: Limits Imposed by Fluorescence of the Detector
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- 04 August 2017, pp. 1026-1027
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Advances in Atomic-resolution and Molecular-detection EELS
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- 04 August 2017, pp. 1028-1029
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Quantitative Aspects of 3D Chemical Tomography in the Scanning Transmission Electron Microscope
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- 04 August 2017, pp. 1030-1031
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The Many Connections Between Atom Probe and Electron Microscopy
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- 04 August 2017, pp. 1032-1033
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Advances in (and a Brief History of) Cathodoluminescence Microscopy
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- 04 August 2017, pp. 1034-1035
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Optimisation of Soft X-Ray Spectroscopy at Room and Liquid Nitrogen Temperatures
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- 04 August 2017, pp. 1036-1037
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Integration of Quantitative Compositional Mapping and Image Processing Routines: A Powerful Approach to Petrologic Investigations
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- 04 August 2017, pp. 1038-1039
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Analysis of Multi-Signal Hyperspectral Datasets Collected by EPMA
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- 04 August 2017, pp. 1040-1041
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Materials Analysis Using Secondary Ion Mass Spectrometry: Challenges and Opportunities
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- 04 August 2017, pp. 1042-1043
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High Spatial Resolution Spectroscopy in a FE-SEM: X-ray Microanalysis and Electron Energy-Loss Spectroscopy
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- 04 August 2017, pp. 1044-1045
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