Microscopy and Microanalysis: Volume 23 - Proceedings of Microscopy & Microanalysis 2017

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Pushing the Limits of Cryo-TEM: Development and Applications

Abstract

Cryo-STEM Tomography with Inpainting

Electron Beam Sources using InGaN Semiconductor Photocathodes for Single-shot Imaging Electron Microscope

New Strategies for Improving CryoEM Single Particle Analysis in EMAN2.2

Towards High Resolution in Cryo-Electron Tomography Subtomogram Analysis

Going Deeper in Cryo Electron Tomography with Neural Networks

Phase Contrast Single Particle Analysis at Atomic Resolutions

Efficient Cryo-EM: Measuring Effects of Particle Orientation in Electron Microscopy

Streptavidin Monolayer-Crystal Affinity Grids: A Step Toward Controlling What Happens During Cryo-EM Sample Preparation

Ion Channel in Lipid Nanodisc By Single Particle Cryo-EM - Pushing The Technology Limit

Lessons Learned from using a Cs-Corrected, Energy-Filtered, Phase-Plate TEM for Single-Particle CryoEM

Development of High-Resolution Transmission Electron Microscopes for Analysis of Biomolecular Structure

Electrostatic Zach Phase Plates for Transmission Electron Microscopy: Status and Future Investigations

Contamination and Charging of Amorphous Thin Films Suitable as Phase Plates for Phase-Contrast Transmission Electron Microscopy

Improving Detectors for Cryo-Electron Microscopy

On-the-Fly Image Quality Evaluation for Single-Particle Analysis Cryo-Electron Microscopy

Accurate Cryo-EM Characterizations of Polypeptoid Vesicles

The Future of Direct Electron Detection in Cryo-TEM

The Title of This Paper Should Be in Title Case (See Below), Single Spaced, Times New Roman, Bold 14-point, and the Text Should Be Left Justified

Hole-Free Phase Plate Energy Filtering Imaging of Graphene: Toward Quantitative Hole-Free Phase Plate Imaging in a TEM

Cryo-FIB Lift-out Sample Preparation Using a Novel Cryo-gripper Tool

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Pushing the Limits of Cryo-TEM: Development and Applications

Abstract