Microscopy and Microanalysis: Volume 13 - Issue S02

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Volume 13 - Issue S02 - August 2007

Contents

Page 23 of 44

Advances in high-resolution electron microscopy

Research Article

Practical Solution for Artificial Image Contrasts in Cs-corrected TEM
J Yamasaki, T Kawai, Y Kondo, N Tanaka
Published online by Cambridge University Press:

05 August 2007, pp. 882-883
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Depth Sectioning of Individual Dopant Atoms with Aberration-Corrected Scanning Transmission Electron Microscopy
HL Xin, V Intaraprasonk, DA Muller
Published online by Cambridge University Press:

05 August 2007, pp. 884-885
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Atomic Scale Imaging and High Sensitive Elemental Analysis with an Aberration Corrected Dedicated STEM
K Nakamura, H Inada, H Tanaka, M Konno, T Yaguchi
Published online by Cambridge University Press:

05 August 2007, pp. 886-887
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Lattice Fringe observations in a Field Emission SEM
VV Ngo, M Hernandez, B Roth, D Joy
Published online by Cambridge University Press:

05 August 2007, pp. 888-889
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Depth Sensitivity of Cs-Corrected TEM Imaging
K Hirahara, J Yamasaki, K Saitoh, N Tanaka
Published online by Cambridge University Press:

05 August 2007, pp. 890-891
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Imaging the six-Membered ring in Si3N4 by a Cs-corrected HRTEM
Z Zhang, U Kaiser
Published online by Cambridge University Press:

05 August 2007, pp. 892-893
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Lattice Aligned Single-Walled Carbon Nanotubes Grown on Silicon Membrane
N Tayebi, ZC Leseman, L Rotkina, J Lyding
Published online by Cambridge University Press:

05 August 2007, pp. 894-895
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Use of Dark-field STEM Imaging to Reveal Phase Separation in a Beta-stabilized Titanium Alloy
A Genç, Ohio State University, University of North Texas
Published online by Cambridge University Press:

05 August 2007, pp. 896-897
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Analysis of Dissociated Grain Boundary Structure: Application of the Local Centrosymmetry Parameter to HRTEM Images
DL Medlin, JC Hamilton, O Uche
Published online by Cambridge University Press:

05 August 2007, pp. 898-899
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Correlating Interfacial Energy with Orientation and Atomistic Structure at Metal Ceramic Interfaces
H Sadan, WD Kaplan
Published online by Cambridge University Press:

05 August 2007, pp. 900-901
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Optimal Noise Filters in High-Resolution Electron Microscopy
K Ishizuka, P Eilers, T Kogure
Published online by Cambridge University Press:

05 August 2007, pp. 902-903
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Effects of Tilt on High-Resolution ADF-STEM Imaging
A Mkhoyan, S Maccagnano, E Kirkland, J Silcox
Published online by Cambridge University Press:

05 August 2007, pp. 904-905
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Image Contrast in High Resolution Aberration Corrected Scanning Transmission Electron Microscopy
M Oxley, K van Benthem, Y Peng, S Pennycook
Published online by Cambridge University Press:

05 August 2007, pp. 906-907
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Planar Diffracted-beam Interferometry/Holography
R Herring
Published online by Cambridge University Press:

05 August 2007, pp. 908-909
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Coherence Property Measurements of Plasmons and Phonons using Planar Diffracted Beam Interferometry/Holography
R Herring
Published online by Cambridge University Press:

05 August 2007, pp. 910-911
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Electron Tomography for Materials Science

Research Article

Electron Tomography for Materials Science
PA Midgley
Published online by Cambridge University Press:

05 August 2007, pp. 912-913
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

EBSD: Traditional and Advanced Applications

Research Article

A Review of In-Situ Electron Backscattered Diffraction Observations of Dynamic Processes
SI Wright, MM Nowell
Published online by Cambridge University Press:

05 August 2007, pp. 914-915
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Electron Backscattered Diffraction Observations of Grain Boundary Cracking for a Udimet 188 Alloy During In-Situ Creep Deformation
C Boehlert
Published online by Cambridge University Press:

05 August 2007, pp. 916-917
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Electron Back-Scattered Diffraction Characterization of Microstructures in Dynamically Deformed Pb-Sn Solder
LN Brewer, BL Boyce, MJ Perricone
Published online by Cambridge University Press:

05 August 2007, pp. 918-919
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Excess Dislocation Density Measurement Dependence on EBSD Step Size
DP Field, CC Merriman, JM Smith
Published online by Cambridge University Press:

05 August 2007, pp. 920-921
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Page 23 of 44

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

Advances in high-resolution electron microscopy

Research Article

Practical Solution for Artificial Image Contrasts in Cs-corrected TEM

Depth Sectioning of Individual Dopant Atoms with Aberration-Corrected Scanning Transmission Electron Microscopy

Atomic Scale Imaging and High Sensitive Elemental Analysis with an Aberration Corrected Dedicated STEM

Lattice Fringe observations in a Field Emission SEM

Depth Sensitivity of Cs-Corrected TEM Imaging

Imaging the six-Membered ring in Si3N4 by a Cs-corrected HRTEM

Lattice Aligned Single-Walled Carbon Nanotubes Grown on Silicon Membrane

Use of Dark-field STEM Imaging to Reveal Phase Separation in a Beta-stabilized Titanium Alloy

Analysis of Dissociated Grain Boundary Structure: Application of the Local Centrosymmetry Parameter to HRTEM Images

Correlating Interfacial Energy with Orientation and Atomistic Structure at Metal Ceramic Interfaces

Optimal Noise Filters in High-Resolution Electron Microscopy

Effects of Tilt on High-Resolution ADF-STEM Imaging

Image Contrast in High Resolution Aberration Corrected Scanning Transmission Electron Microscopy

Planar Diffracted-beam Interferometry/Holography

Coherence Property Measurements of Plasmons and Phonons using Planar Diffracted Beam Interferometry/Holography

Electron Tomography for Materials Science

Research Article

Electron Tomography for Materials Science

EBSD: Traditional and Advanced Applications

Research Article

A Review of In-Situ Electron Backscattered Diffraction Observations of Dynamic Processes

Electron Backscattered Diffraction Observations of Grain Boundary Cracking for a Udimet 188 Alloy During In-Situ Creep Deformation

Electron Back-Scattered Diffraction Characterization of Microstructures in Dynamically Deformed Pb-Sn Solder

Excess Dislocation Density Measurement Dependence on EBSD Step Size

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 13 - Issue S02 - August 2007

Advances in high-resolution electron microscopy

Research Article

Electron Tomography for Materials Science

Research Article

EBSD: Traditional and Advanced Applications

Research Article