Microscopy and Microanalysis: Volume 13 - Issue S02

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Volume 13 - Issue S02 - August 2007

Contents

Page 22 of 44

High Resolution Characterization of Nanoelectronic Materials for Advanced Semiconductor Process Development

Research Article

The Non-destructive Chemical State Analysis of Al-Cu Intermetallic Compound by Ultra-soft X-ray Spectrometer with Al L-alpha.
T Ogiwara, T Kimura, S Fukushima, K Tsukamoto, T Tazawa, S Tanuma
Published online by Cambridge University Press:

05 August 2007, pp. 842-843
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

High Resolution and Energy-Filtered TEM Imaging of Pd Diffusion in Crystalline Si
J Risner-Jamtgaard, X Xu, Q-F Xiao, D Yaney, L Vinh
Published online by Cambridge University Press:

05 August 2007, pp. 844-845
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Electron Microscopy and Analytical Studies of a Novel Tungsten Doped Indium Oxide Deposited by Spray Pyrolysis
D Acosta, A Martinez, C Magana
Published online by Cambridge University Press:

05 August 2007, pp. 846-847
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

TEM Investigation of Near Interface Region in Modified SrTiO3 and LaAlO3 Thin Films on SrTiO3 Substrates
J Börjesson, A Kalabukhov, R Gunnarsson, E Olsson, D Winkler
Published online by Cambridge University Press:

05 August 2007, pp. 848-849
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Characterization of Ytterbium Silicide Thin Films
J Deneen Nowak, SH Song, SA Campbell, CB Carter
Published online by Cambridge University Press:

05 August 2007, pp. 850-851
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Structure of Polycrystalline Thermoelectric Bulk Material AgPbmSbTe2+m
J Howe, H Wang, J Yang
Published online by Cambridge University Press:

05 August 2007, pp. 852-853
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Practical Applications of High-Resolution Field Emission Scanning Electron Microscopy (HR-FESEM) for Magnetic Recording Heads and Disks and Related Materials
M Vargas
Published online by Cambridge University Press:

05 August 2007, pp. 854-855
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Characterization of Nitrogen Content/Distribution in SiON Gate Dielectrics using Angle-Resolved X-Ray Photoelectron Spectroscopy (AR-XPS) and Aberration Corrected Scanning Transmission Electron Spectroscopy (Cs-STEM)
C Lazik, G Conti, Y Uritsky
Published online by Cambridge University Press:

05 August 2007, pp. 856-857
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Advances in high-resolution electron microscopy

Research Article

Au Cluster Behavior Using Aberration Corrected ADF Imaging
P Batson
Published online by Cambridge University Press:

05 August 2007, pp. 858-859
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Practical Electron Microscopy with Correctors and Monochromators
J Ringnalda, B Freitag, D Hubert, M Stekelenburg
Published online by Cambridge University Press:

05 August 2007, pp. 860-861
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The Sub-Electron-Volt-Sub-Angstrom-Microscope (SESAM): Pushing the Limits in Monochromated and Energy-Filtered TEM.
PA van Aken, CT Koch, W Sigle, R Höschen, M Rühle, E Essers, G Benner, M Matijevic
Published online by Cambridge University Press:

05 August 2007, pp. 862-863
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Aberration Corrected Analytical Electron Microscopy of Supported Bimetallic Catalysts
C Kiely, A Herzing, M Watanabe, J Edwards, D Enache, A Carley, G Hutchings
Published online by Cambridge University Press:

05 August 2007, pp. 864-865
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Imaging Active Sites on Platinum Catalytic Nanoparticles Using Aberration-Corrected Electron Microscope
LY Chang, L Cervera-Gontard, C Hetherington, AI Kirkland, D Ozkaya, R Dunin-Borkowski
Published online by Cambridge University Press:

05 August 2007, pp. 866-867
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Studies of Cluster Evolution During Reduction of Pt/Alumina Catalysts
DA Blom, S Bradley, W Sinkler, LF Allard
Published online by Cambridge University Press:

05 August 2007, pp. 868-869
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

High Resolution Microscopy with Single Atom Sensitivity using Aberration-Corrected STEM
K van Benthem, GS Painter, PF Becher, CI Contescu, NC Gallego, S Pennycook
Published online by Cambridge University Press:

05 August 2007, pp. 870-871
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Tackling the Size Problem: Seeing Atoms Smaller for Better TEM Resolution
MA O??Keefe, LF Allard, DA Blom
Published online by Cambridge University Press:

05 August 2007, pp. 872-873
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Intensity and Coherence Measurements of Electon Beams and their Contribution to our Understanding of the Stobbs Factor
R Herring, M Hÿ
Published online by Cambridge University Press:

05 August 2007, pp. 874-875
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Aberration Corrected Tilt Series Reconstruction
S Haigh, AI Kirkland, LY Chang
Published online by Cambridge University Press:

05 August 2007, pp. 876-877
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

UltraSTEM Progress: Flexible Electron Optics, High-Performance Sample Stage
O Krivanek, G Corbin, N Dellby, B Elston, R Keyse, M Murfitt, C Own, Z Szilagyi
Published online by Cambridge University Press:

05 August 2007, pp. 878-879
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Development of Spherical Aberration Corrected 300kV FETEM
H Sawada, F Hosokawa, T Kaneyama, T Tomita, Y Kondo, T Tanaka, Y Oshima, Y Tanishiro, K Takayanagi, T Sannomiya
Published online by Cambridge University Press:

05 August 2007, pp. 880-881
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Page 22 of 44

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

High Resolution Characterization of Nanoelectronic Materials for Advanced Semiconductor Process Development

Research Article

The Non-destructive Chemical State Analysis of Al-Cu Intermetallic Compound by Ultra-soft X-ray Spectrometer with Al L-alpha.

High Resolution and Energy-Filtered TEM Imaging of Pd Diffusion in Crystalline Si

Electron Microscopy and Analytical Studies of a Novel Tungsten Doped Indium Oxide Deposited by Spray Pyrolysis

TEM Investigation of Near Interface Region in Modified SrTiO3 and LaAlO3 Thin Films on SrTiO3 Substrates

Characterization of Ytterbium Silicide Thin Films

Structure of Polycrystalline Thermoelectric Bulk Material AgPbmSbTe2+m

Practical Applications of High-Resolution Field Emission Scanning Electron Microscopy (HR-FESEM) for Magnetic Recording Heads and Disks and Related Materials

Characterization of Nitrogen Content/Distribution in SiON Gate Dielectrics using Angle-Resolved X-Ray Photoelectron Spectroscopy (AR-XPS) and Aberration Corrected Scanning Transmission Electron Spectroscopy (Cs-STEM)

Advances in high-resolution electron microscopy

Research Article

Au Cluster Behavior Using Aberration Corrected ADF Imaging

Practical Electron Microscopy with Correctors and Monochromators

The Sub-Electron-Volt-Sub-Angstrom-Microscope (SESAM): Pushing the Limits in Monochromated and Energy-Filtered TEM.

Aberration Corrected Analytical Electron Microscopy of Supported Bimetallic Catalysts

Imaging Active Sites on Platinum Catalytic Nanoparticles Using Aberration-Corrected Electron Microscope

Studies of Cluster Evolution During Reduction of Pt/Alumina Catalysts

High Resolution Microscopy with Single Atom Sensitivity using Aberration-Corrected STEM

Tackling the Size Problem: Seeing Atoms Smaller for Better TEM Resolution

Intensity and Coherence Measurements of Electon Beams and their Contribution to our Understanding of the Stobbs Factor

Aberration Corrected Tilt Series Reconstruction

UltraSTEM Progress: Flexible Electron Optics, High-Performance Sample Stage

Development of Spherical Aberration Corrected 300kV FETEM

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

High Resolution Characterization of Nanoelectronic Materials for Advanced Semiconductor Process Development

Research Article

Advances in high-resolution electron microscopy

Research Article