Microscopy and Microanalysis: Volume 13 - Issue S02

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Volume 13 - Issue S02 - August 2007

Contents

Page 21 of 44

High Resolution Characterization of Nanoelectronic Materials for Advanced Semiconductor Process Development

Research Article

Electron-beam Induced Interfacial Layer at Ni-BaTiO3 Interfaces of MLCC
Y-J Yoon, Y-S Yu, C-H Kim, B-K Kim
Published online by Cambridge University Press:

05 August 2007, pp. 802-803
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

HRTEM Study on the Interface of Si-based Resonant Tunneling Diodes (RTD) by UHV Wafer Bonding Technology
TH Lee, DK Cha, JG Wang, J Jeon, J Kim, RM Wallace, BE Gnade, MJ Kim
Published online by Cambridge University Press:

05 August 2007, pp. 804-805
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

STM Light Emission from Si (111)-7x7 and Si (111)-4x1-In Surfaces: Optical Investigation with Atomic Resolution
H Imada, A Chiba, M Yokoya, N Yamamoto
Published online by Cambridge University Press:

05 August 2007, pp. 806-807
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

In-situ Observation of Structural Change and Failure Detection for Electrically Active Devices in TEM
Y-W Kim, D-S Ko, S-D Kim, XS Li, GS Park, YK Kim, CG Park
Published online by Cambridge University Press:

05 August 2007, pp. 808-809
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Field-Induced Crystallization of Anodized Nb and NbO Electrolytic Capacitors
M Olszta, J Sloppy, J Li, E Dickey
Published online by Cambridge University Press:

05 August 2007, pp. 810-811
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The Pinning Landscape in High Temperature Superconductor Tapes Revealed by Three-dimensional Characterization of Microstructure
D Miller, M Rpuch, Y Huang, X Li
Published online by Cambridge University Press:

05 August 2007, pp. 812-813
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The Role of Polar Oxide Surface Reconstruction on the Atomic Structure of Polar Oxide Films: HRTEM and SAD Study of Hematite Growth on Magnesia
SH Cheung, A Celik-Aktas, M Weinert, S Chambers, M Gajdardziska-Josifovska
Published online by Cambridge University Press:

05 August 2007, pp. 814-815
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Defects in III-Nitrides-based Distributed Bragg Reflectors
J-G Zheng, B Liu, XL Ji, S-Y Li, R Zhang
Published online by Cambridge University Press:

05 August 2007, pp. 816-817
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Examining the Microstructure and Impurity Distribution of Narrow Lines and Vias
KA Dunn, J Rullan, R van den Boom
Published online by Cambridge University Press:

05 August 2007, pp. 818-819
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Dopant Ordering in Antiferromagnetic Semiconducting Ti Doped Alpha-Fe2O3 Revealed by Electron Diffraction
A Celik-Aktas, T Droubay, SA Chambers, M Gajdardziska-Josifovska
Published online by Cambridge University Press:

05 August 2007, pp. 820-821
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Cylindrical Specimen Geometries for Sub-nm 3-D Characterization of Semiconductor Devices
B Gorman, D Diercks
Published online by Cambridge University Press:

05 August 2007, pp. 822-823
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Electron Tomography of Semiconductor Devices
P Ercius, DA Muller, M Weyland, L Gignac
Published online by Cambridge University Press:

05 August 2007, pp. 824-825
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Characterization and Tomography of Nanoscale Domain Structures in Ferroelectric and Multiferroic Layered Oxides
MA Zurbuchen, DG Schlom
Published online by Cambridge University Press:

05 August 2007, pp. 826-827
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Three Dimensional Compositional Characterization of Dielectric Films with LEAP Tomography
R Ulfig, K Thompson, R Alvis, DJ Larson, P Ronsheim
Published online by Cambridge University Press:

05 August 2007, pp. 828-829
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Annular Dark Field Image Contrast of Strained GaNyAs1-y Epitaxial Layers on GaAs
X Wu, MD Robertson, JA Gupta, J-M Baribeau
Published online by Cambridge University Press:

05 August 2007, pp. 830-831
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Analysis of Nanoscale Stress Fields in Semiconductor Materials and Devices
R Hull, C-C Wu, J Li, J Demarest
Published online by Cambridge University Press:

05 August 2007, pp. 832-833
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

A Novel Automated Method to Measure Strain at the Nano Scale
B Freitag, J Stanley, E Sourty, J Ringnalda, D Hubert
Published online by Cambridge University Press:

05 August 2007, pp. 834-835
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Strain Measurements Using Nano-Beam Diffraction on a FE-STEM
C Vartuli, K Jarausch, H Inada, R Tsuneta, D Dingley, E Marley
Published online by Cambridge University Press:

05 August 2007, pp. 836-837
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Determination of Strain in the Silicon Channel Induced by a Metal Electrode
HC Floresca, J Wang, M Kim, J Kim, CY Kang, R Choi, SC Song, HH Tseng, BH Lee, R Jammy
Published online by Cambridge University Press:

05 August 2007, pp. 838-839
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Strain Fields at a Thin Ge-Sn Layer Sputtered on Ge by Cs Corrected HREM
HA Calderon, MA Vidal, H Ladrón de Guevara
Published online by Cambridge University Press:

05 August 2007, pp. 840-841
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Page 21 of 44

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

High Resolution Characterization of Nanoelectronic Materials for Advanced Semiconductor Process Development

Research Article

Electron-beam Induced Interfacial Layer at Ni-BaTiO3 Interfaces of MLCC

HRTEM Study on the Interface of Si-based Resonant Tunneling Diodes (RTD) by UHV Wafer Bonding Technology

STM Light Emission from Si (111)-7x7 and Si (111)-4x1-In Surfaces: Optical Investigation with Atomic Resolution

In-situ Observation of Structural Change and Failure Detection for Electrically Active Devices in TEM

Field-Induced Crystallization of Anodized Nb and NbO Electrolytic Capacitors

The Pinning Landscape in High Temperature Superconductor Tapes Revealed by Three-dimensional Characterization of Microstructure

The Role of Polar Oxide Surface Reconstruction on the Atomic Structure of Polar Oxide Films: HRTEM and SAD Study of Hematite Growth on Magnesia

Defects in III-Nitrides-based Distributed Bragg Reflectors

Examining the Microstructure and Impurity Distribution of Narrow Lines and Vias

Dopant Ordering in Antiferromagnetic Semiconducting Ti Doped Alpha-Fe2O3 Revealed by Electron Diffraction

Cylindrical Specimen Geometries for Sub-nm 3-D Characterization of Semiconductor Devices

Electron Tomography of Semiconductor Devices

Characterization and Tomography of Nanoscale Domain Structures in Ferroelectric and Multiferroic Layered Oxides

Three Dimensional Compositional Characterization of Dielectric Films with LEAP Tomography

Annular Dark Field Image Contrast of Strained GaNyAs1-y Epitaxial Layers on GaAs

Analysis of Nanoscale Stress Fields in Semiconductor Materials and Devices

A Novel Automated Method to Measure Strain at the Nano Scale

Strain Measurements Using Nano-Beam Diffraction on a FE-STEM

Determination of Strain in the Silicon Channel Induced by a Metal Electrode

Strain Fields at a Thin Ge-Sn Layer Sputtered on Ge by Cs Corrected HREM

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

High Resolution Characterization of Nanoelectronic Materials for Advanced Semiconductor Process Development

Research Article