Microscopy and Microanalysis: Volume 13 - Issue S02

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Volume 13 - Issue S02 - August 2007

Contents

Page 20 of 44

One-dimensional Nanomaterials: Microscopy and Nano-measurements

Research Article

Three-Dimensional Characterization of Core/Shell Nitride Nanowires
I Arslan, AA Talin, F Leonard, GT Wang
Published online by Cambridge University Press:

05 August 2007, pp. 762-763
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Templated Synthesis and Electron Microscopy Characterization of Pt Nanoparticles via Carbon Nanotube/DNA Molecules
L Dong, J Daratzikis, S Hou, P Fraundorf, S Lin
Published online by Cambridge University Press:

05 August 2007, pp. 764-765
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Annealing Study of Porous Tungsten Oxide Nanostructures
MZ López-Paraguay, F Paraguay-Delgado, E Torres, D Lardizabal, JA Lumbreras
Published online by Cambridge University Press:

05 August 2007, pp. 766-767
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Synthesis and Characterization of Antimony-doped Tin Oxide Nanostructures
J Wang, D Zhou, P Fraundorf, J Liu
Published online by Cambridge University Press:

05 August 2007, pp. 768-769
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Advanced Methods of Nanowire and Nano-Device Analysis
DC Bell, C Barrelet, B Tian, C Lieber
Published online by Cambridge University Press:

05 August 2007, pp. 770-771
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Fabrication and Characterization of Selectively Patterned MgO Nanowires
R Martens, G Kim, G Thompson, B Kim, A Gupta
Published online by Cambridge University Press:

05 August 2007, pp. 772-773
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Formation of Carbon Nanofilaments by Metal Dusting
P Ferreira, P Szakalos, J Vander Sande
Published online by Cambridge University Press:

05 August 2007, pp. 774-775
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Effect of Synthesis Parameters on the Gold Nanostructures Produced using an Oleamine Reductant
P Clasen, R Tiruvalam, S Ma, MP Harmer, C Kiely
Published online by Cambridge University Press:

05 August 2007, pp. 776-777
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

HRTEM Study of Titania Nanotubes Grown by Low Temperature Hydrothermal Synthesis
D Robertson, S Ghosh, P Guptasarma, M Gajdardziska-Josifovska
Published online by Cambridge University Press:

05 August 2007, pp. 778-779
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

An in situ TEM Study of Field Emission of Electrons from LaB6 Nanowires
H Zhang, J Tang, Q Zhang, O Zhou, L-C Qin
Published online by Cambridge University Press:

05 August 2007, pp. 780-781
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

An Electron Diffraction RDF Study of Amorphous Boron Nanowires
H Deniz, L-C Qin, H Zhang, J Tang
Published online by Cambridge University Press:

05 August 2007, pp. 782-783
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Diameter Dependence of Ge-doped Si Nanowires Fabricated via Vapor-Liquid-Solid Growth
TE Clark, X Zhang, K-K Lew, L Pan, P Nimmatoori, JM Redwing, EC Dickey
Published online by Cambridge University Press:

05 August 2007, pp. 784-785
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

High Resolution Characterization of Nanoelectronic Materials for Advanced Semiconductor Process Development

Research Article

TEM Contributions to Silicon Technology Advancement
K Johnson, X Lin, L Pan, B Miner
Published online by Cambridge University Press:

05 August 2007, pp. 786-787
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Transmission Electron Microscopy of TiW/Ti/Pt/Au Gate Metallizations for InAs Channel High Electron Mobility Transistors
Q Zhang, R Dormaier, T Buehl, B Liu, S Mohney
Published online by Cambridge University Press:

05 August 2007, pp. 788-789
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

A Method for Site-specific Specimen Preparation of Si Device after 65 nm-node Technology using FIB-STEM/TEM System
T Yaguchi, M Konno, Y Suzuki, T Kamino, H Inada, J Azuma
Published online by Cambridge University Press:

05 August 2007, pp. 790-791
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Thermally Driven Chemical Diffusion and Failure of InGaAs-AlGaAs Strained Single Quantum Well Laser Diodes
B Foran, N Presser, Y Sin, SC Moss
Published online by Cambridge University Press:

05 August 2007, pp. 792-793
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

TEM-EELS Study on the Ash Damage and Repair of Porous Low-k Films
J Wang, D Cha, PM Matz, CE Smith, DW Mueller, RF Reidy, MJ Kim
Published online by Cambridge University Press:

05 August 2007, pp. 794-795
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Spatially Resolved Core-loss EELS Study of E-beam Grown and RF-sputtered CoFeB/MgO/CoFeB Magnetic Tunnel Junctions
JJ Cha, JC Read, RA Buhrman, DA Muller
Published online by Cambridge University Press:

05 August 2007, pp. 796-797
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

New Method for Deep 90° Slope Cuttings of Semiconductor Devices
W Gruenewald
Published online by Cambridge University Press:

05 August 2007, pp. 798-799
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

HRTEM and EELS Study of Ni-BaTiO3 Interfacial Reactions Kinetics
GY Yang, AV Polotai, EC Dickey, CA Randall
Published online by Cambridge University Press:

05 August 2007, pp. 800-801
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Page 20 of 44

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

One-dimensional Nanomaterials: Microscopy and Nano-measurements

Research Article

Three-Dimensional Characterization of Core/Shell Nitride Nanowires

Templated Synthesis and Electron Microscopy Characterization of Pt Nanoparticles via Carbon Nanotube/DNA Molecules

Annealing Study of Porous Tungsten Oxide Nanostructures

Synthesis and Characterization of Antimony-doped Tin Oxide Nanostructures

Advanced Methods of Nanowire and Nano-Device Analysis

Fabrication and Characterization of Selectively Patterned MgO Nanowires

Formation of Carbon Nanofilaments by Metal Dusting

Effect of Synthesis Parameters on the Gold Nanostructures Produced using an Oleamine Reductant

HRTEM Study of Titania Nanotubes Grown by Low Temperature Hydrothermal Synthesis

An in situ TEM Study of Field Emission of Electrons from LaB6 Nanowires

An Electron Diffraction RDF Study of Amorphous Boron Nanowires

Diameter Dependence of Ge-doped Si Nanowires Fabricated via Vapor-Liquid-Solid Growth

High Resolution Characterization of Nanoelectronic Materials for Advanced Semiconductor Process Development

Research Article

TEM Contributions to Silicon Technology Advancement

Transmission Electron Microscopy of TiW/Ti/Pt/Au Gate Metallizations for InAs Channel High Electron Mobility Transistors

A Method for Site-specific Specimen Preparation of Si Device after 65 nm-node Technology using FIB-STEM/TEM System

Thermally Driven Chemical Diffusion and Failure of InGaAs-AlGaAs Strained Single Quantum Well Laser Diodes

TEM-EELS Study on the Ash Damage and Repair of Porous Low-k Films

Spatially Resolved Core-loss EELS Study of E-beam Grown and RF-sputtered CoFeB/MgO/CoFeB Magnetic Tunnel Junctions

New Method for Deep 90° Slope Cuttings of Semiconductor Devices

HRTEM and EELS Study of Ni-BaTiO3 Interfacial Reactions Kinetics

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

One-dimensional Nanomaterials: Microscopy and Nano-measurements

Research Article

High Resolution Characterization of Nanoelectronic Materials for Advanced Semiconductor Process Development

Research Article