Microscopy and Microanalysis: Volume 13 - Issue S02

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Volume 13 - Issue S02 - August 2007

Contents

Page 14 of 44

Microscopy in Nanotechnology

Research Article

TEM Study of Ag Nanoparticles Featuring Localized Surface Plasmon Resonance (LSPR)
Y Wang, LJ Sherry, RP Van Duyne, LD Marks
Published online by Cambridge University Press:

05 August 2007, pp. 522-523
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

High-Temperature Structural Modification of Bundled Singled-Walled Carbon Nanotubes
HR Gutierrez, UJ Kim, PC Eklund
Published online by Cambridge University Press:

05 August 2007, pp. 524-525
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Effect of Sintering Temperature on the Microstructure of Rare-Earth doped Y2O3 Ceramics
S Ma, KS Rao, S Wu, C Kiely, MP Harmer
Published online by Cambridge University Press:

05 August 2007, pp. 526-527
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

STM and HRTEM of Nanostructures and Metal Nanocrystals on SrTiO3 (001)
HL Marsh, DS Deak, F Silly, PD Nellist, AI Kirkland, MR Castell
Published online by Cambridge University Press:

05 August 2007, pp. 528-529
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Microscopy Applications in the Semiconductor Industry
J Mardinly
Published online by Cambridge University Press:

05 August 2007, pp. 530-531
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Nanoscale Engineering and E-Beam Lithography Using (S)TEM
DC Bell
Published online by Cambridge University Press:

05 August 2007, pp. 532-533
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Electron Beam Drilling of Nanopores on Silicon Nitride Membranes Using a Transmission Electron Microscope
SJ Chen, DG Howitt, BC Gierhart, RL Smith, SD Collins
Published online by Cambridge University Press:

05 August 2007, pp. 534-535
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Study of Tantalum impurity in HfO2 based on DFT
Y Mino, B HionSuck, L Eunha, P JongBong
Published online by Cambridge University Press:

05 August 2007, pp. 536-537
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

TEM Measurements of Grain Orientation in Nanoscale Cu Interconnects using ACT Software
JH An, PJ Ferreira
Published online by Cambridge University Press:

05 August 2007, pp. 538-539
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

SEM and TEM Analysis of Cryomilled Nanocrystalline Al Powder
B Ahn, N Erdman, S Nutt
Published online by Cambridge University Press:

05 August 2007, pp. 540-541
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Electron Beam Induced Light Emission by Surface Plasmon on One-dimensional Plasmonic Crystal
T Suzuki, N Yamamoto
Published online by Cambridge University Press:

05 August 2007, pp. 542-543
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Anchoring Nanoclusters and Nanoparticles: Challenges and Opportunities
J Liu
Published online by Cambridge University Press:

05 August 2007, pp. 544-545
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Determination of Nanocluster Size Distributions From HAADF-STEM images
NL Okamoto, S Mehraeen, A Kulkarni, S Nemana, BC Gates, ND Browning
Published online by Cambridge University Press:

05 August 2007, pp. 546-547
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

The 1Å Double Aberration Corrected ETEM and ESTEM Project at York
PL Gai, ED Boyes
Published online by Cambridge University Press:

05 August 2007, pp. 548-549
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

In Situ Measurement of the Activity of Individual Ceria Zirconia Nanoparticles
R Wang, PA Crozier, R Sharma, JB Adams
Published online by Cambridge University Press:

05 August 2007, pp. 550-551
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

In-Situ Fabrication of 1D Nanostructures in the Dynamic TEM
ML Taheri, BS Simpkins, T LaGrange, BW Reed, N Teslich, ND Browning
Published online by Cambridge University Press:

05 August 2007, pp. 552-553
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Observation of the Selective Deposition and Growth of Metal Nano-Structures with In-situ UHV Electron Microscopy
K Furuya, M Tanaka, M Shimojo, M Takeguchi, K Mitsuishi
Published online by Cambridge University Press:

05 August 2007, pp. 554-555
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

In situ investigation of dynamic growth of Cu-nanorod by transmission electron microscopy
JS Wu, JX Fu, YP Zhao
Published online by Cambridge University Press:

05 August 2007, pp. 556-557
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Parallel Beam Nano-Diffraction Analysis of Individual Nanoparticles
M Malac, F Wang, R Egerton, Y Taniguchi
Published online by Cambridge University Press:

05 August 2007, pp. 558-559
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Novel Preparation Steps and Imaging Procedures Suitable for Electronmicroscopical Characterization of Zeolite Structures
B Tesche, FC Jentoft, R Schloegl, SR Bare, LT Nemeth, S Valencia, A Corma
Published online by Cambridge University Press:

05 August 2007, pp. 560-561
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Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Page 14 of 44

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

Microscopy in Nanotechnology

Research Article

TEM Study of Ag Nanoparticles Featuring Localized Surface Plasmon Resonance (LSPR)

High-Temperature Structural Modification of Bundled Singled-Walled Carbon Nanotubes

Effect of Sintering Temperature on the Microstructure of Rare-Earth doped Y2O3 Ceramics

STM and HRTEM of Nanostructures and Metal Nanocrystals on SrTiO3 (001)

Microscopy Applications in the Semiconductor Industry

Nanoscale Engineering and E-Beam Lithography Using (S)TEM

Electron Beam Drilling of Nanopores on Silicon Nitride Membranes Using a Transmission Electron Microscope

Study of Tantalum impurity in HfO2 based on DFT

TEM Measurements of Grain Orientation in Nanoscale Cu Interconnects using ACT Software

SEM and TEM Analysis of Cryomilled Nanocrystalline Al Powder

Electron Beam Induced Light Emission by Surface Plasmon on One-dimensional Plasmonic Crystal

Anchoring Nanoclusters and Nanoparticles: Challenges and Opportunities

Determination of Nanocluster Size Distributions From HAADF-STEM images

The 1Å Double Aberration Corrected ETEM and ESTEM Project at York

In Situ Measurement of the Activity of Individual Ceria Zirconia Nanoparticles

In-Situ Fabrication of 1D Nanostructures in the Dynamic TEM

Observation of the Selective Deposition and Growth of Metal Nano-Structures with In-situ UHV Electron Microscopy

In situ investigation of dynamic growth of Cu-nanorod by transmission electron microscopy

Parallel Beam Nano-Diffraction Analysis of Individual Nanoparticles

Novel Preparation Steps and Imaging Procedures Suitable for Electronmicroscopical Characterization of Zeolite Structures

Microscopy and Microanalysis

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Volume 13 - Issue S02 - August 2007

Microscopy in Nanotechnology

Research Article