Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

The FIB-SEM Laboratory: Sample Preparation and Beyond

Abstract

Time of Flight Backscatter and Secondary Ion Spectrometry in a Helium Ion Microscope

COLDFIB - The New FIB Source from Laser Cooled Atoms

Using FIB-SEM as a Platform for the Positioning and Correlated Characterization of III-V Nanowires

Control and in-situ imaging of heat & gas mediated processes in FIB/SEM system

Using Three-Dimensional Electron Backscatter Diffraction Data to Measure Grain Boundary Properties in Metals and Ceramics

The Challenges of High-Resolution Analytic FIB-SEM Tomography and Their Solution

3D Microstructure Reconstruction and Characterization of Solid-State Electrolyte with Varying Porosity

Crystallography at the Nanoscale: t-EBSD Study of npAu Catalysts

Direct Real Time Microstructure Evolution Observation of Ti-6Al-4V Alloy by In-Situ EBSD during Cycling Heating and Cooling at Elevated Temperatures using heater in SEM/FIB Systems

Cryo-FIB Lamella Milling: A Comprehensive Technique to Prepare Samples of Both Plunge- and High-pressure Frozen-hydrated Specimens for in situ Studies.

FIB/SEM Processing of Biological Samples

An Improved FIB Sample Preparation Technique for Site-specific Plan-view Specimens: A New Cutting Geometry

FIB Milling strategies for TEM Sample Preparation of Spheroidal Powder Particles

The Path to Quantitative 3D Metrology: FIB-SEM 3D Tomography in Data Storage Industry

High-Accuracy Sample Preparation for Three Dimensional Atom Probe Tomography Using Orthogonal Column Layout FIB-SEM and its STEM function

Vacuum-Assisted Ex situ Lift Out for Plan View FIB Specimen Preparation

Development of Automated Micro-Sampling System and Application to Semiconductor Devices

Development of Electron Optics System for "ETHOS" High-Performance FIB-SEM

A Method to Prepare TEM Specimens by Focused Ion Beam Milling for Cu/diamond Composites

A Universal Method of In Situ FIB Lift-Out for Cryogenic Samples

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

The FIB-SEM Laboratory: Sample Preparation and Beyond

Abstract