Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

The Joy of Scanning Electron Microscopy

Abstract

My Joy of Research in SEM

Visualizing Astigmatism in the SEM Electron Probe

Detection Systems of Ultra-High-Resolution SEMs

'High Resolution' Is Often Sought in SEM Imaging, But Establishing Visibility May Be the Challenge: Always Ask "What Might I Be Missing?"

EBSD: Now Spanning Centimeters to Nanometers!

Complementarity of On-Axis Transmission Kikuchi Diffraction and Forward Scatter Diffraction Imaging in SEM

Transmission Kikuchi Diffraction of the Thermally Grown Oxide on Grain-refined NiAl-Zr

Non-local Denoising of EBSD Patterns for Enhanced Indexing

Applying SEM, EPMA and EBSD Analytic Techniques on Solder Joint for Microelectronic Package Development

The Joy in imaging the Auger Electron Signal in a FESEM using a Segmented Annular BSED and Stage Bias

Energy-Momentum Spectroscopy by Highly Parallelized Wavelength- and Angularly-Resolved Cathodoluminescence in the Scanning Electron Microscope

Joy of Scanning with Electron and X-ray Imaging

DELTA - A Novel Ultra-Low Voltage SEM for Electron Spectroscopic Imaging

Statistical Analysis of Secondary Electron Spectroscopic Images Using Ultra-Low Energies Reveal Nanoscale Surface Morphology of Functional Organic Blends

A Review of Electron Channeling Contrast Imaging for Non-Destructive Defect Analysis of Crystalline Solids

Grain Size Analysis in Lithium Aluminate Ceramics

Orientation Mapping by Electron Channeling (OMEC) and Hybrid Stage/Beam-Rocked Electron Channeling Patterns

In-situ Monitoring TEM Specimen Preparation with Different Electron Detectors in a SEM-FIB System

Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope

The Joy of Nanoscale Imaging and Spectroscopy in a Low Accelerating Voltage Scanning Transmitted Electron Microscope

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2018

Analytical and Instrumentation Science Symposia

The Joy of Scanning Electron Microscopy

Abstract