Proceedings of Microscopy & Microanalysis 2018
Analytical and Instrumentation Science Symposia
Machine Learning and Compressive Sensing for Signal Processing and Image Reconstruction in Microscopy and Microanalysis
Abstract
Inpainting Versus Denoising for Dose Reduction in STEM
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 482-483
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Increasing the Speed of EELS/EDS Mapping Through Dynamic/Adaptive Sampling Methodologies
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- 01 August 2018, pp. 484-485
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Compressive Sensing Reconstruction for EDS Analysis
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- 01 August 2018, pp. 486-487
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Focused-Probe STEM Ptychography: Reconstruction Methods, Transfer Functions and Signal-to-Noise
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- 01 August 2018, pp. 488-489
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A Natural Basis for Unsupervised Machine Learning on Scanning Diffraction Data
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- 01 August 2018, pp. 490-491
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Exit-Wave Reconstruction and Phase Analysis Using a Hitachi SU9000 FE-SEM
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- 01 August 2018, pp. 492-493
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Next Steps for Compressively Sensed Video in Transmission Electron Microscopy
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- 01 August 2018, pp. 494-495
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Gesture-Based Control of the Scanning Electron Microscope Using a Low-Cost Webcam Sensor
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- 01 August 2018, pp. 496-497
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High-speed Fly-Scan Volumetric Imaging
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 498-499
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Multivariate Analysis and Compressed Sensing Methods for Spectroscopic Electron Tomography of Semiconductor Devices
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- 01 August 2018, pp. 500-501
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Inpainting Assisted Controlled Rotation Tomography (CORT)
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 502-503
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Deep Learning Based Atom Segmentation and Noise and Missing-Wedge Reduction for Electron Tomography
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- 01 August 2018, pp. 504-505
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Deep Learning for Lensless Compressive Imaging
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- 01 August 2018, pp. 506-507
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Problems and Progress in Automating Electron Microscopy Segmentation
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 508-509
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An Autonomous Microscopy Workflow for Structure Determination from Atomic-Resolution Images
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- 01 August 2018, pp. 510-511
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Identifying Atoms in High Resolution Transmission Electron Micrographs Using a Deep Convolutional Neural Net
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- 01 August 2018, pp. 512-513
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Pioneering the Use of Neural Network Architectures and Feature Engineering for Real-Time Augmented Microscopy and Analysis
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- 01 August 2018, pp. 514-515
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Real-time Image Processing and Restoration Prototype for the SEM: Initial Steps
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 516-517
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Tricky Registration for Unruly Data: Image Registration of Low-Signal-to-Noise Cryo-STEM Data
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- 01 August 2018, pp. 518-519
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Machine Learning Powered Image Segmentation
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- 01 August 2018, pp. 520-521
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