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Visualizing Astigmatism in the SEM Electron Probe

Published online by Cambridge University Press:  01 August 2018

Mandy C. Nevins ,
Matthew D. Zotta ,
Richard K. Hailstone  and
Eric Lifshin
Mandy C. Nevins
Affiliation:
Rochester Institute of Technology, 54 Lomb Memorial Dr, Rochester, NY, USA
Matthew D. Zotta
Affiliation:
SUNY Polytechnic Institute, Albany, NY, USA
Richard K. Hailstone
Affiliation:
Rochester Institute of Technology, 54 Lomb Memorial Dr, Rochester, NY, USA
Eric Lifshin
Affiliation:
SUNY Polytechnic Institute, Albany, NY, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 604 - 605
Copyright
© Microscopy Society of America 2018 

References

[1] Lifshin, E., et al., Microscopy Today 25(3 2017) p 18.Google Scholar
[2] Nevins, M., et al., Microscopy & Microanalysis 23(S1 2017) p 126.Google Scholar
[3] Zotta, M., et al., Microscopy & Microanalysis 23(S1 2017) p 124.Google Scholar