4pi Analysis, Inc.—1022
3500 Westgate Drive
Suite 403
Durham, NC 27707-2534
USA
Ph: 919-489-1757
Fax: 919-489-1487
4pi is demonstrating its RevolutionEDXTM SD System: an EDS system offering Silicon-drift detector technology with high throughput and ultra-fast spectrum imaging. New features in the easy-to-use 4pi Revolution® software include smart multi-point and line scan collection. See how 4pi's superior technical support and unique X-ray microanalysis and high-resolution imaging tools (including real-time drift correction, hyperspectral imaging, and large-format digital imaging) can benefit your research or high-volume production laboratory
Abeam Technologies—417
5286 Dunnigan Court
Castro Valley, CA 94546
USA
Ph: 510-415-6032
Fax: 510-538-4862
Advanced MicroBeam, Inc.—604
4217C King Graves Road
P.O. Box 610
Vienna, OH 44473
USA
Ph: 330-394-1255
Fax: 330-394-1834
Advanced MicroBeam, Inc. celebrates our 20th year and continues to provide the foremost, after-market solution in WDS Analytical Systems; offering the latest hardware advances in a PC based system. Our Probe for Windows Enterprise Software, a research grade analytical software suite, is used by laboratories worldwide. Stop by our booth for a demo and to discuss long term upgrade solutions for your electron microprobe. Advanced MicroBeam also sells restored electron microprobes, a WDS solid-state super Detector capable of millions of counts per second, a variety of hardware and software upgrades for the JEOL 8200/8500 electron microprobe, electron microprobe service contracts and commercial microprobe analytical services.
Advanced Microscopy Techniques Corp.—704
3 Electronics Avenue
Danvers, MA 01923
USA
Ph: 978-774-5550
Fax: 978-739-4313
AMT will exhibit its complete line of CCD Cameras for TEMs for all applications. Integration of our camera line with the microscope continues to be a priority. Come visit us and see.
Allied High Tech Products, Inc.—613
2376 East Pacific Place
Rancho Dominguez, CA 90220
USA
Ph: 800-675-1118
Ph: 310-635-2466
Fax: 310-762-6808
Allied High Tech Products, Inc. has provided products for microscopic sample evaluation for over 20 years. Allied's state-of-the-art MultiPrepTM Polishing System, TechCut 5TM Sectioning Machine and TechCut 4TM Low Speed Saw will be demonstrated. Zeiss' line of materials microscopes will be shown, as well as a full range of Allied's consumables.
Applied Image, Inc.—710
1653 East Main Street
Rochester, NY 14609
USA
Ph: 585-482-0300
Fax: 585-288-5989
“Your Single Source Photonics Solution” Provider dedicated to innovative Opto-Imaging Products and Services. Providing custom and off the shelf linear scales, test targets, reticles, encoders, image analysis standards, sinusoidal arrays, photo masks, ronchi rulings and other imaged components on various substrate materials. Applied Image, where image concepts become reality.
ASM International—331
9639 Kinsman Road
Materials Park, OH 44073
USA
Ph: 440-338-5151
Fax: 440-338-8629
ASM International, the Materials Information Society, is the premier resource for information and networking for materials engineers, scientists, researchers and educators. ASM's mission is to benefit the materials community by providing scientific, engineering and technical knowledge, education, networking and professional development. Through our membership, our conferences, our chapters, our affiliate societies, our seminars and symposia, our partnering with other societies, our reference collections and our communications media, ASM makes this information available and usable worldwide.
Attocube Systems AG—823
Koeniginstrasse 11 a (Rgb)
Muenchen, 80539
Germany
Ph: 49-89-28778090
Fax: 49-89-287780919
Attocube systems AG manufactures and distributes a complete line of easy-to-use scanning probe microscopes and nanopositioning systems for temperatures in the range from 300 K down to 10 mK! The innovative nanopositioners are also compatible with HV and UHV environments as well as high magnetic fields up to 28 T. Central to our proven suite of low-temperature microscopes is our powerful combination of fully automated and absolute reliable low-temperature positioning devices with modular and flexible scanning probe sensors, designed specifically to meet the needs of today's low temperature research. Our instruments give users the ability to analyze samples down to the atomic level, even at milli-Kelvin-temperatures.
Biophotonics International—216
Berkshire Common
2 South Street
Pittsfield, MA 01201
USA
Ph: 413-499-0514
Fax: 413-442-3180
Biophotonics International magazine is designed for people who are using photonic technology in medical or biotechnical products and procedures, and for key researchers who are looking for new techniques and products to solve their problems. It is distributed free to those who use or apply photonics.
Bruker AXS Microanalysis—1109
1239 Parkway Avenue Suite 203
Ewing, NJ 08628
USA
Ph: 609-771-4400
Fax: 609-771-4411
Bruker AXS Microanalysis' QUANTAX EDS system delivers fast reliable analyses results across a broad range of applications for all kinds of samples ranging from powders and metals to coatings. Its LN2-free XFlash® Silicon Drift Detectors (SDD) are vibration and maintenance free, while delivering unbeatable energy resolution (125 eV Mn Kα 100,000 cps).
Buehler LTD—506
41 Waukegan Road
Lake Bluff, IL 60044
USA
Ph: 847-295-6500
Fax: 847-295-7979
For over half a century Buehler has been the leading manufacturer of scientific instruments and supplies for cross-sectional analysis. Buehler products are used throughout the world by metallurgical laboratories, quality control departments, and failure analysis facilities for the analysis of all types of materials including ceramics, composites, semi-conductors, metals, rocks and minerals, and plastics.
Cambridge University Press—828
32 Avenue of the Americas
New York, NY 10013-2473
USA
Ph: 212-337-5000
Fax: 212-691-3239
Cambridge University Press publishes Microscopy and Microanalysis for the Microscopy Society of America. The journal offers original research papers in the fields of microscopy, imaging, and compositional analysis that describe techniques and instrumentation, and the applications of these to the imaging and analysis of microstructure. Please stop by our booth to peruse sample copies of this journal as well as our other peer-reviewed journals and high-quality books.
CAMECA Instruments Inc.—212
4301 Garrity Blvd. Ste. 201
Nampa, ID 83687
USA
Ph: 208-442-6559
Fax: 208-442-6595
CAMECA is introducing its next generation Atom Probe for 3D chemical analysis of nanovolumes with atomic resolution: the revolutionary LA-WATAP. The LA-WATAP offers laser assisted atom probe mode allowing the analysis of semiconductors and insulators, together with a uniquely large field of view (100 nm × 100 nm) and with high mass resolution. The SX100 EPMA together with its PC software, Peak Sight, supports new and evolving applications with new software features and new hardware developments. The NanoSIMS 50/50L is a break-through high-resolution imaging SIMS finding applications in materials, cellular biology, pharmacology, geology and astrophysics. It is now proposed with seven detectors (masses)in parallel and the choice between EM or FC for each detector. Please stop by our booth to discuss CAMECA solutions to your micro-analytical problems. CAMECA, for over 40 years, providing electron and ion-probe microanalysis solutions.
Carestream Molecular Imaging—415
4 Science Park
New Haven, CT 06511
USA
Ph: 203-786-5631
Carl Zeiss MicroImaging, Inc.
One Zeiss Drive
Thornwood, NY 10594
USA
Ph: 800-233-2343
Fax: 914-681-7446
Carl Zeiss offers a full line of upright, inverted, stereo and confocal microscopes, image analysis systems and digital cameras for biomedical, and materials microscopy. Zeiss specializes in high-resolution digital imaging systems for demanding applications such as fluorescence, GFP, confocal, functional surfaces and microsystems technology. For more information, please visit http://www.zeiss.com/micro or call 800-233-2343.
Carl Zeiss SMT, Inc.—804
One Corporation Way
Peabody, MA 01960
USA
Ph: 978-826-7903
Fax: 978-532-5696
Carl Zeiss SMT's Nano Technology Systems Division offers a complete range of leading edge technology ultra high resolution GEMINI FESEMs, multipurpose and extended pressure SEMs, energy filtering TEMs and CrossBeam, FIB systems. The ULTRA, based on the SUPRA GEMINI FESEM comprises two high efficiency, high-resolution In-column detectors which provides ultra high resolution simultaneous SE and BSE imaging. In addition, the CrossBeam, FIB workstations with the GEMINI FESEM column enable precise and fast 3-D analysis and TEM sample prep. The new LIBRA EFTEM offers a unique in-column OMEGA filter concept combined with Koehler illumination for unrivalled flexibility in imaging and analysis combined with genuine ease of operation.
Chroma Technology Corp.—606
10 Imtec Lane
PO Box 489
Rockingham, VT 05101
USA
Ph: 800-824-7662
Ph: 802-428-2500
Fax: 802-428-2525
Chroma Technology Corp. is an employee-owned company that specializes in the design and manufacture of precision optical filters and coatings. Our filters have been developed for a variety of applications: low light fluorescence microscopy and cytometry; spectrographic imaging in optical microscopy; laser-based confocal and multiphoton instrumentation; and Raman spectroscopy. For each of these applications we provide the greatest accuracy in color separation, optical quality, and signal purity.
Delaware Diamond Knives, Inc.—713
3825 Lancaster Pike
Wilmington, DE 19805
USA
Ph: 800-222-5143
Ph: 302-999-7476
Fax: 302-999-8320
Delaware Diamond Knives puts sharp edges on hard materials. Our diamond knives for ultrathin sectioning and histo knives for thicker sections are known for longevity. The triangular tungsten carbide knife offers a durable replacement for glass. DDK's sapphire knife is the best sectioning tool for vibrating microtome applications.
Denton Vacuum, Inc.—927
1259 North Church Street
Moorestown, NJ 08057
USA
Ph: 856-439-9100
Fax: 856-439-9111
Denton Vacuum is a leading U.S. manufacturer with over four decades of leadership in design, manufacture and support of vacuum deposition systems for science and industry. Reliability and support are assured spare parts are always available for rapid delivery. We carry a full line of EM systems and accessories. Stop by to see our newest generation of sample preparation systems. Quality products, dependable customer service and a commitment to your satisfaction and success.
DiATOME U.S.—811
1560 Industry Road
P.O. Box 410
Hatfield, PA 19440
USA
Ph: 215-412-8390
Fax: 215-412-8450
Diatome the innovator in diamond knife technology manufactures and distributes a complete line of Diamond knives for the sectioning of biological and materials specimens at room and cryo temperatures in varying angles and sizes. Special knives and custom blades are available meeting all of the researchers microtomy needs.
Direct Electron, LP—420
13240 Evening Creek Drive
Ste 311
San Diego, CA 92128
USA
Ph: 858-384-0291
Fax: 858-366-4981
Dune Sciences, LLC—335
1900 Millrace Drive
Eugene, OR 97403
USA
Ph: 541-359-4710
Duniway Stockroom Corp.—715
1305 Space Park Way
Mountain View, CA 94043
USA
Ph: 650-969-8811
Fax: 650-965-0764
Duniway Stockroom Corp. specializes in vacuum equipment and supplies; ion pumps and controls; flanges, gaskets, bolts and nuts; vacuum gauges and controls; mechanical pumps and rebuild kits; supplies (oils, greases, hoses, bell jars) diffusion pumps and leak detectors. Equipment rebuilding services and a variety of reconditioned equipment.
DVC Company—612
10200 Highway 290 West
Austin, TX 78736
USA
Ph: 512-301-9564
Fax: 512-288-2961
e2v scientific instruments ltd.—614
Sirius House, Watery Lane
Wooburn Green
High Wycombe
Buckinghamshire HP10 0AP
UK
Ph: +44 1628 533060
Fax: +44 1628 533034
e2v scientific instruments is a world leading independent manufacturer of Silicon Drift (SDD) and Si(Li) detectors for high resolution X-ray spectroscopy, used primarily in EDS applications on electron microscopes and XRF analyzers. e2v also offers full Si(Li) detector repair and upgrade services from facilities in Europe and North America.
EDAX, Inc.—104
91 McKee Drive
Mahwah, NJ 07430
USA
Ph: 201-529-6277
Fax: 201-529-3156
For many years EDAX has lead the industry as the world's largest supplier of EDS, EBSD and WDS systems and as the technical and performance leader. EDAX continues to raise the standard with a series of SDDs that fulfills the promise of improved collection efficiency and superior light element performance, while the EDS software continues to offer advanced and innovative features in an easy to use format, providing the best results and tools that assure confidence in those results.
Electron Microscopy Sciences—813
1560 Industry Road
P.O. Box 550
Hatfield, PA 19440
USA
Ph: 215-412-8400
Fax: 215-412-8450
Electron Microscopy Sciences will have on display their revolutionary new Tissue slicers, Processors (LYNX), Microwave ovens, Plunge Freezers, Field Microscopes, and Vacuum Equipment including our High Resolution Sputter Coaters and Critical Point Driers. As well on display will be their Brand New Catalog which includes their entire line of chemicals, supplies and accessories for all of the microscopy fields as is shown in there 750+ page catalog.
El-Mul Electron & Ion Detection Solutions, Ltd.
Soreq
P.O. Box 571
81104 Yavne
Israel
Ph: +972 (0) 8-943-4184
Fax: +972 (0) 8-942-2676
Energy Beam Sciences, Inc.—822
29B Kripes Road
East Granby, CT 06026
USA
Ph: 800-992-9037
Ph: 860-841-1086
Fax: 860-653-0422
Energy Beam Sciences is a world leader in the manufacture and distribution of products in the field of Electron Microscopy. We manufacture consumables such as Filaments, Apertures and Specimen Mounts that have for decades been recognized for their superior quality. We are also the exclusive US distributors for SEM specimen preparation products from the Polaron Range and Emitech; Detector and Infrared Camera Systems from KE Developments; and LaB6 and TFE Cathodes from Denka Corporation.
Ernest F. Fullam, Inc.—619
750 Pierce Road
Suite 2
Clifton Park, NY 12065
USA
Ph: 518-877-0820
Fax: 518-887-3885
For sputter coaters, substages, substrates, supplies, standards, carbon coaters, custom equipment, evaporation materials, embedding media, CCD imaging systems, tweezers, tools, tensile testers, turbo evaporators, books, grids, apertures, LM and SEM manipulators, darkroom supplies, film racks, general lab equipment and special order items.
ETS-Lindgren—220
400 High Grove Boulevard
Glendale Heights, IL 60139
USA
Ph: 630-307-7200
Fax: 630-307-7571
ETS-Lindgren, the world's leading manufacturer of MRI shielding systems, offers worldwide service and support. With extensive capabilities in MRI shielding, ETS-Lindgren can assist with project engineering, installation, and testing. Using reliable construction methods such as copper shielding, integrated RF/magnetic shielding and silicon-based construction, all ensure long-term image quality.
Evex Analytical—816
857 State Road
Princeton, NJ 08540
USA
Ph: 609-252-9192
Fax: 609-252-9091
Evex the world leader in X-ray microanalysis is now the leader in X-ray NanoAnalysis. Evex's advanced detector and digital imaging technology (SEM.TEM) is controlled by Evex's powerful, yet easy to use NanoAnalysis software. Evex-QDD LN-Free Advanced Detector Technology, now in its 5th year of production continues to impress users world-wide with its extremely high count rate, light element detection, and performance. All Evex products are covered by Evex's Warranty and are serviced by Evex's factory trained service engineers. Call Evex for more information at (609) 252-9192 or visit the Evex website at http://www.evex.com
FEI Company—528
5350 NE Dawson Creek Drive
Hillsboro, OR 97124
USA
Ph: 503-726-7500
Fax: 503-726-7509
fei.com/sales
FEI's Tools for Nanotech continue pushing the boundaries of microscope innovation with sub-nm SEM and sub-Å TEM imaging. Our SEM, TEM, ESEMTM, and DualBeamTM solutions deliver 3D imaging, characterization and analysis capabilities for the broadest range of materials and life science applications. Come see how our microscope solutions will help you meet your research challenges today and into the future.
Fischione Instruments—424
9003 Corporate Circle
Export, PA 15632
USA
Ph: 724-325-5444
Fax: 724-325-5443
Fischione Instruments features a full line of Electron Microscopy Instrumentation. TEM Specimen Preparation Instruments include the Twin-Jet Electropolisher, Dimpling Grinder, Ultrasonic Disk Cutter, Ion Mill, and the Plasma Cleaner which eliminates contamination in TEM and SEM applications. The NanoMill combines ultra-low ion energies and a concentrated beam for artifact-free preparation. The Automated Sample Prep (ASaP) System (Pat. Pend.) significantly enhances the image quality and analytical data derived from SEM specimens. Imaging Instruments include the high angle Annular Dark Field (ADF) detector for high resolution STEM imaging. TEM Specimen Holder Technology includes the Advanced Tomography Holder and Ultra-Narrow Gap Tomography Holder affording high tilt and extended fields of view in high resolution TEMs, the Dual-Axis Tomography Holder where in-plane specimen rotation increases data quality, and the On-Axis Rotation Tomography Holder for acquiring complete tomographic information from cylindrical or conically-shaped specimens. The Nano-Probe TEM Holder allows in-situ, dynamic TEM experimentation.
Gatan, Inc.—1130
Corporate Headquarters
5794 West Las Positas Blvd.
Pleasanton, CA 94588
USA
Ph: 925-463-0200
Fax: 925-463-0204
Gatan designs and manufactures instruments and products for electron microscopes that enable and advance EM applications. Gatan is the recognized leader in the industry and our products set the industry standards. Our engineers understand the application criteria of our customers and provide them with the right solutions. GATAN GETS IT!
Geller MicroÅnalytical Laboratory
426e Boston Street
Topsfield, MA 01983
USA
Ph: 978-887-7000
Fax: 978-887-6671
Geller MicroÅnalytical Laboratory is Certified to both ISO-9000:2000 and ISO-17025 for technical competency. Our products include computer control systems for digital imaging and electron microprobes, traceable magnification reference standards (up to 1,000,000× magnification), reference materials for surface analysis and microprobe techniques, high vacuum desiccators, and metallographic equipment. Analytical services include Auger electron spectroscopy, SEM, X-ray, Electron Microprobe, profilometry, and metallography.
Hamamatsu Corp.—522
360 Foothill Road
Bridgewater, NJ 08807
USA
Ph: 908-231-0960
Fax: 908-231-1218
Hamamatsu Corporation will present the latest innovations in low light level scientific imaging products. Come by to discuss the technology behind the new Electron Multiplication cameras and find out about the new streak camera based Fluorescence Lifetime Imaging Microscopy system. Our staff of experienced regional managers will be on hand to answer questions about these and other Hamamatsu Photonic Systems products for your application.
Hirox-USA, Inc.—1423
1060 Main Street
Suite 302
River Edge, NJ 07661
USA
Ph: 201-342-2600–200
Fax: 201-342-7322
Hitachi High Technologies America, Inc.—1329
5100 Franklin Drive
Pleasanton, CA 94588
USA
Ph: 925-218-2800
Fax: 925-218-3230
Hitachi High Technologies America, a global leader serving the needs of manufacturing companies and operations, provides a wide array of advanced electron microscopes. Our product line up includes Scanning Electron Microscopes (SEM), Transmission Electron Microscopes (TEM), Variable Pressure SEM (VP SEM), Field Emission SEM (FE SEM), and Focused Ion Beam/Electron Beam Systems (FIB/SEM combination). Renowned scientists in R&D and manufacturing facilities around the world use Hitachi electron microscopes for applications in the materials industries and failure analysis labs. Our customers can expect more experience, reliability and customer support when choosing Hitachi electron microscopes.
HORIBA Jobin Yvon, Inc.—311
3880 Park Avenue
Edison, NJ 08820-3012
USA
Ph: 732-494-8660
Fax: 732-549-2571
HORIBA Jobin Yvon Molecular and Microanalysis Division's product line offers spectroscopic techniques of steady-state and time-resolved Fluorescence, Raman, Photo-luminescence, Cathodoluminescence, FT-IR and EDXRF instruments. We are proud to be leaders in important, increasingly demanding applications, and expanding techniques in biology, nanotechnology, pharmaceuticals, chemistry and semiconductors that require outstanding system performance.
HREM Research, Inc.—1325
14-48 Matsukazedai
Higashimatsuyama
Saitama, 355-0055
Japan
Ph: 81-493-35-3919
Fax: 81-493-35-3919
We are a worldwide leading company developing versatile software for Quantitative Electron Microscopy: HREM/STEM image simulation package based on FFT Multislice and a suite of DigitalMicrograph plug-ins. The latter includes Software Cs-corrector (Exit wave reconstruction and STEM-HAADF deconvolution), Software Monochromator (EELS deconvolution), Strain mapping and more. Please visit our booth and experience our software personally.
Hummingbird Scientific—837
8300 28th Court NE
Unit 200
Lacey, WA 98516
USA
Ph: 360-480-7435
Fax: 360-252-6474
Hysitron, Inc.—714
10025 Valley View Road
Minneapolis, MN 55344
USA
Ph: 952-835-6366
Fax: 952-835-6166
In keeping with its tradition of innovation, Hysitron, Inc., the world leader in nanomechanical test solutions, now offers the first instrument capable of direct-observation depth-sensing indentation in a transmission electron microscope. Hysitron's TEM PicoIndenterTM product also can be configured to perform direct-observation quantitative compression testing of individual nanoparticles.
Imago Scientific Instruments Corporation
5500 Nobel Drive
Madison, WI 53711
USA
Ph: 608-274-6880
Fax: 608-442-0622
Imago's Local Electrode Atom Probe (LEAP®) MICROSCOPY allows materials-research scientists to analyze specimens in 3-D with atomic resolution, offering key insights into how a material's atomic structure affects its mechanical and electrical properties. Information acquired by LEAP® allows researchers to link phenomena on the nanoscale to properties at the macro scale.
Intellection Corp.—1319
10955 Westmoor Dr., Ste. 400
Westminister, CO 80021
Ph: 303-474-5036
Fax: 303-648-4234
International Centre for Diffraction Data (ICDD)—623
12 Campus Boulevard
Newtown Square, PA 19073
USA
Ph: 610-325-9814
Fax: 610-325-9823
ICDD offers material identification databases designed for rapid materials identification. PDF-4+ 2007 is an advanced database containing comprehensive material coverage for inorganic materials and contains numerous features such as digitized patterns, molecular graphics and atomic parameters. PDF-4+ features electron diffraction simulations based on calculations using electron scattering from atomic parameters or scattering factors.
Ionizing Radiation Imaging Systems (IRIS)—736
P.O. Box 228
Mendocino, CA 95460
USA
Ph: 831-241-1644
IXRF Systems, Inc.—303
15715 Brookford Drive
Houston, TX 77059
USA
Ph: 281-286-6485
Fax: 281-286-2660
IXRF Systems, Inc offers industry leading microanalysis software for EDS/EDXRF analysis. The IXRF software suite includes: standard/standardless compositional analysis, feature/phase/particle analysis, spectral imaging/mapping, and image stitching/montaging. The IXRF also boasts free software upgrades/updates for life! IXRF also carries an exclusive line of adaptable XRF (X-ray Fluorescence) products for the SEM that yield increased detection sensitivity and elemental accuracy.
JENOPTIK GmbH—712
Business Unit Sensor Systems
Göschwitzer Straße 25
D-07745 Jena
Germany
Ph: 49 3641 65 3150
Fax: +49 3641 65 2144
ProgRes® digital microscope cameras made by JENOPTIK, Germany, are available for qualitative and quantitative imaging in light microscopy. High resolution images ranging from 1.4 to 12 million pixels with finest detail and exceptional color fidelity as well as an easy to operate advanced capture software make ProgRes® cameras the choice of reference for documentation, archiving or analysis of your images. ProgRes® cameras are imported in the US in co-operation with Liebmann Optical Co., Easthampton MA.
JEOL USA, Inc.—515, 1027
11 Dearborn Road
Peabody, MA 01960
USA
Ph: 978-535-5900
Fax: 978-536-2264
JEOL USA is a global leader of electron optical instrumentation for high-end scientific research and industrial applications. JEOL provides innovative technologies, products and services to promote advancements in the core markets we serve including materials science, nanotechnology, biotechnology and biology. Core product groups include SEMs, TEMs, sample prep tools, analytical instruments, and tools for the semiconductor industry. A new 30kV dual-column FIB/SEM will be featured.
John Wiley & Sons, Inc.—316
111 River Street
Hoboken, NJ 07030
USA
Ph: 201-748-6896
Fax: 201-748-6142
K E Developments Ltd—822
The Mount
Toft
Cambridge CB23 2RL
UK
K E Developments will premiere their new generation solid state backscatter detector. 30 years experience has culminated in detectors with speed, sensitivity and usability never seen before. STEM and EBIC detectors are similarly enhanced. Also see our wide range of chamberscope products including the latest USB enabled cameras with distortion correction.
Labx
PO Box 216
478 Bay Street
Midland, Ontario L4R 1K9
Canada
Ph: 705-528-6888
Fax: 705-528-0270
Online auctions and classified ad marketplace for buying new and used laboratory equipment. From light microscopes to electron microscopes, from vacuum pumps to spectrophotometers, you can search LabX for the products you need and deal directly with thousands of equipment vendors from around the world to buy equipment.
Ladd Research—504
83 Holly Court
Williston, VT 05495
USA
Ph: 802-658-4961
Ph: 800-451-3406(US)
Fax: 802-660-8859
Microscope and Laboratory Supplies/Equipment: Sputter Coaters, Vacuum Evaporators, Laboratory Microwave Ovens, Apertures, Pinholes, Slits as small as 0.5 μm Applications: EMs, FIBs, X-ray, MaterialPlatinum, Molybdenum, Tantalum, Tungsten, Titanium, SS, etc., Conductive Paints, Aquadags, Electrodags, Graphite Paint, Tungsten Alumina Crucibles, Torr Seal, Torr Lube, SEM/TEM Supplies
Leco Corporation—1426
3000 Lakeview Avenue
St. Joseph, MI 49085
USA
Ph: 269-985-5711
Fax: 269-982-8987
Lehigh University Microscopy School
5 East Packer Avenue
Bethlehem, PA 18015
USA
Ph: 610-758-5133
Fax: 610-758-4244
Courses are held every June and include SEM and EDS for the New SEM Operator, SEM and X-ray Microanalysis, Problem Solving with SEM, Quantitative X-ray Microanalysis of Bulk Specimens and Particles, Analytical Electron Microscopy at the Nanometer-Scale, FIB Instrumentation and Applications, and SPM: From Fundamentals to Advanced Applications.
Leica Microsystems, Inc.—430
2345 Waukegan Road
Bannochburn, IL 60015
USA
Ph: 800-248-0123
Ph: 847-405-0123
Fax: 847-405-0164
Your Image Starts Here! Leica's high-quality sample preparation for TEM, SEM, AFM, and LM includes five new products for biological and materials sample preparation, including the world's first automated microwave tissue processor for EM samples. Also: the EM PACT2 high-pressure freezer with rapid transfer system for correlative LM and EM; EM UC6 ultramicrotome with optional cryochamber; EM AFS2 for low temperature sample processing, embedding, and polymerization for freeze substitution and PLT; EM IGL immunogold labeling system.
Luxel—508
515 Tucker Avenue
Friday Harbor, WA 98250
USA
Ph: 360-378-4137
Fax: 360-378-4266
Luxel Corporation is the preeminent supplier of free-standing sub-micron thin films. LuxFILM TEM supports are strong, filmed supports that can span very large unobstructed areas up to 2 mm. These new TEM grids are beam stable, and robust to cryogenic temperatures. The supports allow viewing the entire specimen without grid bars.
M.E. Taylor Engineering, Inc.
21604 Gentry Lane
Brookeville, MD 20833
USA
Ph: 301-774-6246
Fax: 301-774-6711
Materials Analytical Services
3945 Lakefield Court
Suwanee, Georgia 30024
USA
Ph: 800-421-8451
Ph: 770-866-3200
Fax: 770-866-3259
MAX Detector Repair Group LLC
2211 Parview Road
Suite 5
Middleton, WI 53562
USA
Ph: 608-829-0110
MAX Detector Repair Group LLC is a full service repair facility for liquid nitrogen-cooled microanalysis detectors. Our central Wisconsin location allows us to provide quick, economical service to customers in all parts of the USA. We have over 45 years combined experience in design, assembly, and engineering analysis.
The McCrone Group, Inc.—827
850 Pasquinelle Drive
Westmont, IL 60559
USA
Ph: 800-622-8122
Fax: 630-887-7764
The McCrone Group celebrates over 50 years providing microscopy services: McCrone Microscopes and Accessories features Linkam Thermal Microscopy systems (Peltier, Freeze Drying, Cryo), Olympus microscopes, PAX-it image archiving, the USB2 digital camera, and supplies. McCrone Associates is a consulting laboratory for microscopy, ultra-microanalysis and materials analysis, including PLM, SEM, TEM, SIMS, XPS, Raman and FTIR. The College of Microscopy provides training in PLM, SEM, TEM, FTIR, sample preparation and digital imaging. Also featured are the online Atlas of Microscopic Particles, and Modern Microscopy, an online journal.
McCrone Research Institute
2820 South Michigan Avenue
Chicago, IL 60616
USA
Ph: 312-842-7100
Fax: 312-842-1078
The McCrone Research Institute is the world's premier not-for-profit microscopy and microanalysis educational organization. Founded in 1960, by Walter C. McCrone, the Institute conducts 50 or more courses in Chicago each year mainly to scientists, technicians, and other specialists in the chemical and pharmaceutical industries, military, government, environmental, industrial research, and forensic science laboratories. The Institute publishes The Microscope journal and other books on microscopy and is host to the Inter/Micro Conference held each year in downtown Chicago.
Micro Optics of Florida
3941 Southwest 47th Avenue
Davie, FL 33314
USA
Ph: 954-791-0082
Particle lift out system for electron microscopes and FIB's normally used as 1,000× to 4,000×. Any particle can be placed on a grid. This is a free-standing system that does not occupy FIB or EM scope time Great for multiple FIB or EM machines
Micro Star Technologies
511 FM 3179
Huntsville, TX 77340
USA
Ph: 800-533-2509
Ph: 936-291-6891
Fax: 936-294-9861
Micro Star Technologies manufactures diamond knives for ultramicrotomy and accepts all brands for resharpening or exchange. We produce a compact, low price cryo ultramicrotome system for electron and scanning probe microscopy. We also make AFM single crystal diamond tips as well as diamond micro-indenters. Get complete information and prices at microstartech.com.
Minitool
634 University Avenue
Los Gatos, CA 90614
USA
Ph: 408-395-1585
Fax: 408-395-1605
Minitool produces the finest line of high quality, precision micro instruments for under microscope investigatory applications and specimen manipulation.
Minus K Technology
420 South Hindry Avenue
Unit E
Inglewood,CA 90301
USA
Ph: 310-348-9656
Fax: 310-348-9638
Minus K negative-stiffness isolation systems are ideal for SPMs, SEMs, interferometers and optical and confocal microscopes. They require no air or electric power. Products include bench top platforms, workstations and floor platforms. With guaranteed 1/2-Hz natural frequencies, isolation performance is 10 to 100 times better than high-performance air tables.
Mirero, Inc.
708 Daehyun Technowohd Bldg.
174 Ojeongdong, Uiwangsi
Gyeonggi-do
Korea
Ph: 82-31-458-5411
Fax: 82-31-429-8294
Mirero Inc. is specialized in electron beam technology as well as image processing. Our main products are scanning electron microscope (SEM), electron beam welder (EBW) and image analyzer.
MSA Megabooth—130
263 Danern Drive
Beavercreek, OH 45430
USA
Ph: 937-255-9413
Fax: 937-656-7292
The MSA Megabooth provides MSA services to meeting attendees. It is comprised of several MSA committees Education (a book display, DVD library, exhibitor tutorials and Project MICRO), Certification Board, Membership, the Placement Office and the Tech Forum. Also located at the booth are Nestor's Internet Café and Microscopy Today.
MTS Nano Instruments—916
701 Scarboro Road
Suite 100
Oak Ridge, TN 37830
USA
Ph: 865-481-8451
Fax: 865-481-8455
Nanofactory Instruments AB—208
Walleriusgatan 2, 412 58
Göteborg
Sweden
Ph: +46 (0) 31 16 28 10
Ph: 925-819-6609
Fax: +46 (0) 31 16 59 85
Nanonics Imaging Ltd.
Manhat Technology Park
Malcha
Jerusalem 91487
Israel
Ph: 1-866-220-6828
Ph: 972-2-678-9573
Fax: 972-2-648-0827
Ultimate resolution AFM/NSOM/SPM systems including the first multiple probe SPM system. Hallmarked by free optical and electron/ion beam axis integration with confocal, microRaman, SEM's, TEM's, FIB's, 10 K operation. Exposed AFM probes/tips surpassing nanotube profiling with deep trench capabilities, nanowire glass insulated electrical probes, NanoheaterTM thermal conductivity, electrochemical, gas and liquidnanochemical deposition.
Nascatec GmbH—520
Wankelstr 14
Stuttgart 70563
Germany
Ph: 49-711-686-89490
Fax: 49-711-686-89499
Nikon Instruments, Inc.—835
1300 Walt Whitman Road
Melville, NY 11747
USA
Ph: 631-547-8535 x8500
Fax: 631-547-0362 x8652
Nikon Instruments Inc. will exhibit the new TE2000 inverted research microscope, the premiere workstation for multimode, livecell microscopy, FRAP and FRET, integrated with Nikon's new complete Turnkey TIRF system. Featured are the new C1, high performance main stream confocal imaging system; SMZ1500,15:1 zoom stereo microscope with OCC base for highest contrast; and the E600 Pol microscope with reflected light for the material sciences. We will also feature Nikon's newest digital imaging solutions. Nikon Instruments Inc. will exhibit; TE2000E2 PFS Perfect Focus Inverted Research Microscope, the premiere workstation for multimode, live cell microscopy that is FRAP and FRET enabled; The new AZ100 Multizoom Macro/Micro imaging workstation, with 5× to 500× magnification range performing low magnification DIC imaging and 4 channel Epi-Fluorescence.
Norsam Technologies, Inc.—333
PO Box 31279
Santa Fe, NM 87594
USA
Ph: 505-984-1133
Fax: 815-550-1394
Novelx, Inc.—607
3746 Mt Diablo Boulevard
Suite 100
Lafayette, CA 94549
USA
Ph: 925-962-0889–304
Fax: 925-962-3885
Novelx has miniaturized and driven the cost out of the core technology inside a field emission scanning electron microscope (SEM). With this innovation, Novelx is introducing the mySEM and delivering research-grade SEM imaging capabilities directly to the benchtops of researchers and developers who need to view nanoscale objects and materials. In a compact design that installs easily, the mySEM delivers performance previously only available in high-end field emission SEMs, at a fraction of the cost. Optimized for low-voltage operation and no need to coat non-conductive samples, the mySEM is an ideal choice for imaging energy-sensitive samples, biomaterials and thin films.
Olympus America, Inc.—304
3500 Corporate Parkway
Center Valley, PA 18034
USA
Ph: 484-896-5000
Fax: 484-896-7131
Leading the way in automated microscopy, Olympus features the BX61 motorized microscope. Integrated with Olympus MicroSuite? image analysis software and one of our digital cameras provides an automated seamless solution guaranteed to be flexible, fast, and reliable. Additionally, the BX51 research microscope and new SZX motorized stereomicroscope will be displayed.
Olympus Industrial America—304
One Corporate Drive
Orangeburg, NY 10962
USA
Ph: 845-398-9480
Fax: 845-398-9443
Leading the way in automated microscopy, Olympus features the BX61 motorized microscope. Integrated with Olympus MicroSuite image analysis software and one of our digital cameras provides an automated seamless solution guaranteed to be flexible, fast, and reliable. Additionally, the BX51 research microscope and new SZX motorized stereomicroscope will be displayed.
Olympus Soft Imaging Solutions—304
12596 West Bayaud Avenue
Suite 300
Lakewood, CO 80228
USA
Ph: 888-FIND-SIS
Ph: 303-234-9270
Fax: 303-234-9271
Olympus Soft Imaging Solutions, formerly Soft Imaging System, has been a worldwide leader for image acquisition and processing for more than 15 years. Highly sophisticated software and hardware for TEM, SEM and Light Microscopy combine into immediate increases in efficiency and data security for your image analysis needs.
Olympus Soft Imaging System
Hammer Str. 89
Munster 48153
Germany
Ph: +49 (251) 79800-0
Ph: +49 (251) 79800-6060
Omniprobe, Inc.—922
10410 Miller Road
Dallas, TX 75238
USA
Ph: 214-572-6800
Fax: 214-572-6801
Omniprobe specializes in the design and manufacture of analytical tools and accessories for the FIB and SEM with primary applications in the semiconductor industry and research. Products include the AutoProbe family of chamber-mounted, precision nanomanipulators for electrical testing, nano-assembly and in-situ lift-out TEM sample preparation; Gas injection system for the FIB/SEM that is suitable for automation, the revolutionary Short-CutTM system that optimizes the TEM sample prep process in a wafer fab environment, a sample transfer system for air-sensitive TEM samples that are made in the FIB, and others currently in development.
Oxford Instruments America, Inc.—620
300 Baker Avenue
Suite 150
Concord, MA 01742
USA
Ph: 978-369-9933
Fax: 978-369-8287
The world leader in X-ray micro-analysis and EBSD systems for interpreting micro-chemical and crystallographic information on SEMs and TEMs. ONIA is developing technologies to improve resolution and sensitivity for nano-analysis applications. OINA also distributes the Kleindiek nano-precision stages and manipulators, further enhancing its position in this market.
Parallax Research—929
PO Box 12212
Tallahassee, FL 32317
USA
Ph: 800-580-5481
Ph: 850-580-5481
Fax: 850-668-4133
Parallax produces the new HEXS Wavelength Dispersive Spectrometer (WDS) for electron beam and X-ray microanalysis. For EDS detectors. Parallax makes the LoMaX optic that allows the detector to collect up to 10× the low energy X-rays. OmniX is the new Parallax EDS/WDS product for complete X-ray spectroscopy in micro-analysis.
Physical Electronics—711
18725 Lake Drive East
Chanhassen, MN 55317
USA
Ph: 952-828-6200
Fax: 952-828-6176
Physical Electronics (PHI) is a subsidiary of ULVAC-PHI, the world's leading supplier of UHV surface analysis instrumentation used for research and development of advanced materials in a number of high technology fields including: nanotechnology, microelectronics, storage media, bio-medical, and basic materials such as metals, polymers, and coatings. PHI's innovative XPS, AES, and SIMS technologies provide our customers with unique tools to solve challenging materials problems and accelerate the development of new materials and products. Our product line includes: the PHI 700 NanoprobeAES, the Quantera SXMXPS, the PHI 5000 VersaProbeXPS, the TRIFT V nanoTOF TOF-SIMS, and the ADEPT-1010 DSIMS. For additional information visit our website at http://www.phi.com
PNSensor GmbH—419
Römerstr. 28
München D-80803
Germany
Ph: (49) 89 30908713
Fax: (49) 89 30908711
Probe Software, Inc.—318
885 Crest Drive
Eugene, OR 97405
USA
Ph: 541-343-3400
Fax: 541-343-3400
probesoftware.com
Probe Software is dedicated to offering the best software for acquisition, automation and analysis for modern Jeol and Cameca electron microprobes. Probe For Windows (for quantitative analysis) and Probe Image (for imaging) are both designed for maximum compatibility to interface SIMULTANEOUSLY with your existing Jeol 8900, 8200, 8500 and Cameca SX100 computer systems. Probe Software utilizes a sophisticated and advanced native TCP/IP implementation for all instrument communication, therefore no alteration to your current system is required. This means that both the OEM and Probe Software applications can work together to improve your productivity and expand your analytical options.
Protochips, Inc.—610
840 Main Campus Drive
Suite 3500
Raleigh, NC 27606
USA
Ph: 919.341.2612
Fax: 919.341.2748
Protochips creates the world's most advanced specimen supports for electron microscopy. Our products enable the highest resolution of nanostructures in their native environments and have proven themselves to be of enormous value in Life Science and Materials Science applications all the way from R&D through product Q/A. Our two leading product lines include: C-flatTM—The premier holey carbon film for cryo-transmission electron microscopy (cryoTEM) and, DuraSiNTM—The market leading silicon nitride specimen support in materials science applications for TEM and X-ray microscopy.
PulseTor LLC—329
1816 St. Johns Bluff Road
Suite 305
Jacksonville, FL 32246
USA
Ph: 904-646-3069
Fax: 904-646-3131
PulseTor's MAXIM Silicon Drift Detector and TORRENT Advanced Digital Processor offer the MAXIMum performance in the industry for high rate-high resolution EDS. PulseTor, through its subsidiary AAT, offers new Si(Li) detectors, detector repair, and upgrades to SDDs using your existing system electronics. Visit us at http://www.pulsetor.com.
Quorum Technologies Ltd.—822
South Stour Avenue
Kent TN23 7RS
UK
Ph: +44 (0)1233 646332
Fax: +44 (0)1233 640744
Quorum Technologies offer a comprehensive selection from the prestigious Emitech EM sample preparation and Polaron cryo preparation brands. Quorum manufactures the market leading PP2000 cryo-SEM and compact K1250X. Both allow a wide range of hydrated and beam sensitive samples to be explored with ease using SEM and FIB/SEM. Other products include sputter coaters and high and low vacuum carbon and metal evaporators for SEM and TEM, critical point and freeze dryers. The versatile K1050X RF plasma barrel reactor is ideal for etching, ashing and cleaning applications. Quorum is represented by Energy Beam Sciences in the USA and Soquelec in Canada.
Rap-ID US—437
6660 North High Street
Suite 2A
Worthington, OH 43085
USA
Ph: 614-888-0023
Fax: 614-888-0025
Liquid Particle Explorer and Single Particle Explorer for the measurement and identification of particles. Utilizing image analysis and Raman Spectroscopy, size, shape, count and chemical composition can be measured. Layer Explorer provides a none contact, none destructive measurement of silicone layer thickness in pre-filled syringes. Eyetech particle size analyzer featuring image analysis and Laser Obscuration Time (LOT) to provide Dynamic Shape analysis of particles in wet and dry applications.
Renishaw, Inc.—336
5277 Trillium Boulevard
Hoffman Estates, IL 60192
USA
Ph: 847-286-9953
Fax: 847-286-9974
Renishaw Raman Microscopes provide chemical information at a spatial resolution of less than 1 micron. Renishaw's spectrometers perform from 244 nm to 830 nm, analyze to within 10 cm−1 of the laser line and include direct 2-D Raman and photoluminescence imaging. Process and Forensic Raman Spectrometers interface options include optical, AFM and SEM microscope.
RMC Products Boeckeler Instruments, Inc.—603
4650 South Butterfield Drive
Tucson, AZ 85714
USA
Ph: 520-745-0001
Ph: 800-552-2262
Fax: 520-745-0004
Boeckeler Instruments Inc will be exhibiting and demonstrating its RMC Products line of sample preparation equipment for electron and optical microscopy including: Power Tome Ultramicrotomes for biological and materials science ultra thin sectioning; cryoultramicrotomes; automated chemical and microwave assisted tissue processing; glass knife making; freeze substitution; cryofixation; diamond knives; MR and MT series rotary microtomes.
Scanning2008/FAMS, Inc.
P.O. Box 485
Mahwah, NJ 07430
USA
Ph: 201-818-1010
Fax: 201-818-0086
FAMS sponsors the Annual Spring SCANNING Meeting, a 3-day scientific program featuring sessions and short courses, and social events. SCANNING 2008, the 19th Annual International Scientific Session, will be held in Washington, D.C. in April. Approximately 150 papers are presented over the three days, in 5 concurrent sessions each day. Special discounts to students.
Scientific Instruments & Applications, Inc.—621
2773 Heath Lane
Duluth, GA 30096
USA
Ph: 770-232-7785
Fax: 770-232-1791
SIA offers the most affordable digital imaging solutions for TEM. The best choice of pixel resolutions, download speeds, and the lowest noise among lens coupled camera systems. A flexible design for bottom, side, and custom/multiport TEM interface with the largest field of view, even on a bottom port. Diffraction beam stop when required. We also offer the best future upgrade policy in the industry. Visit us at http://www.sia-cam.com
Sela USA, Inc.—722
2045 Martin Avenue
Ste 206
Santa Clara, CA 95050
USA
Ph: 408-235-8500
Fax: 408-524-8501
Come and see Sela's leading technology for automated SEM, TEM, and STEM sample preparation. Existing product line includes the MC600i microcleaving systems for SEM, and the EM3 for STEM and TEM sample preparation. Newly introduced technology include the new Xact system that challenges the current tool set for preparing TEM samples. This technology represents a major leap from existing capabilities and offers a new paradigm for the future of TEM sample preparation.
SEMTech Solutions, Inc.
6 Executive Park Drive
North Billerica, MA 01862
USA
Ph: 978-663-9822
Fax: 978-663-9823
North American sales and service provider of new E-Beam Lithography equipment and Electron Beam Roughness Analyzers (3D SEM), and Nano-Indenters manufactured by Elionix. STS also sells and services refurbished SEMs.
SII NanoTechnology USA, Inc.—126
19865 Nordhoff Street
Northridge, CA 91324
USA
Ph: 818-280-0745
Fax: 818-280-0408
SIINT USA's, ∼50 mm2, excellent resolution, Silicon Drift, X-Ray Detector, at <133 eV, outputs >600 Kcps at 0.25 μs. Developed for icroanalysis the LN2 free, Vortex®-EM, cycles without performance degradation <3 minutes. Compelling advantages include extremely high-count rates with virtually zero loss in resolution and no peak shift, despite count rate.
Siskiyou Corporation—418
110 SW Booth Street
Grants Pass, OR 97526
USA
Ph: 541-479-8697
Ph: 877-313-6418
Fax: 541-479-3314
Micromanipulators and related hardware to facilitate simultaneous high-contrast and fluorescence imaging of patch-clamp samples for electrophysiology research and micro-sample manipulation. Parfocalizable/parcenterable lens assemblies for laser ablation that mount in standard microscope objective threads.
Smart Imaging Technologies—709
1770 Saint James Place
Suite 414
Houston, TX 77056
USA
Ph: 877-280-1100
Ph: 713-589-3500
Fax: 713-589-3252
smartimtech.com
SIMAGISR Smart Imaging Spreadsheet is advanced user-friendly image analysis software. SIMAGISR ready-to-run solutions for semiconductor, nanotechnology, material science, metallurgy, biology and customized applications require minimal end user training. SIMAGISR 2D/3D works with SEM, TEM, FIB, AFM and optical. SIMAGISR full library of built-in analysis algorithms eliminate end user coding requirements.
Smiths Detection—416
21 Commerce Drive
Danbury, CT 06810
USA
Ph: 203-207-9700
Fax: 203-207-9780
Smiths Detection Scientific simplifies science by developing rapid, easy-to-use application-focused tools for cleaning validation, material research and identification, manufacturing, industrial hygiene, and quality control. Our quick and easy-to-use instruments and software broaden the range of end-user capability in various market sectors including Pharmaceutical, Public Laboratories, Specialty Chemical, Industrial, Environmental, Homeland Security, Military. Smiths Detection uses a range of advanced technologies that include microscopy, Fourier transform infrared (FT-IR) spectroscopy, ion mobility spectrometry (IMS), and Raman spectroscopy to help provide users with the most easy-to-use, accurate and definitive tools available. Our easy-to-use instrumentation along with our proven customer support and extensive spectral libraries is why Smiths Detection's your partner in chemical analysis.
South Bay Technology, Inc.—819
1120 Via Callejon
San Clemente, CA 92673
USA
Ph: 800-728-2233
Fax: 949-492-1499
South Bay Technology, Inc. Manufactures Materials Processing Equipment for applications in Electron Microscopy, Optical Microscopy, Metallography, Microelectronics, and Single Crystal Processing. Products include wire saws and diamond wheel saws for precision cutting; lapping and polishing machines and fixturing for controlled surface preparation; 2 and 3 axis goniometers for orientation, cutting and polishing of single crystals; ion milling, dimpling, disc cutting, and plasma cleaning systems for TEM sample preparation; ion beam sputter deposition and etching systems to prepare fine grain thin films for high resolution imaging using FESEM; plasma etching, reactive ion etching (RIE), and backside polishing systems for microelectronic processing; and high precision polishing systems for nanotechnology applications.
SPI Supplies—803
P.O. Box 656
West Chester, PA 19381-0656
USA
Ph: 610-436-5400
Fax: 610-436-5755
SPI Supplies: Manufacturer and distributor of sample preparation equipment, consumable supplies and chemicals for electron, light and scanning probe microscope laboratories. Exhibit booth features our Osmium Plasma Coater, RoHS compliant sputter/carbon coaters and our new Solid State Plasma Prep. Sample substrates include perforated silicon nitride membrane windows for TEM as well as HOPG and mica for SPM.
Technical Manufacturing Corporation—510
15 Centennial Drive
Peabody, MA 01960
USA
Ph: 978-532-6330
Fax: 978-531-8682
TMC manufactures a complete line of vibration isolation systems. New products include acoustic enclosures, magnetic field cancellation systems, active tabletop vibration isolators and FloorPlatform PZT, a low-cost, active vibration cancellation system for SEM columns. Ask for our 126-page catalog.
Technotrade International, Inc.—708
7 Perimeter Road
Manchester, NH 03103
USA
Ph: 603-622-5011
Fax: 603-622-5211
TECHNOTRADE is the distributor of the Wohlwend HPF 01 Compact High Pressure Freezing system and all associated accessories in the US and Canada. The HPF 01 is a further development of the original Leica High Pressure Freezing system with the added advantages of reduced liquid nitrogen use, smaller footprint, quieter operation and lower cost.
Ted Pella, Inc.—703
P.O. Box 492477
Redding, CA 96049
USA
Ph: 800-237-3526
Ph: 530-243-2200
Fax: 530-243-3761
Ted Pella, Inc is an innovative manufacturer and distributor of consumables, supplies and specimen preparation tools for microscopy labs. Renowned for SEM mounts and sample holders, TEM grids and supports films, calibration tools, Cressington sputter and carbon coating systems, specimen preparation tools and the BioWave® Pro microwave tissue processing system.
Tescan USA, Inc.—330
508 Thomson Park Drive
Cranberry Twp., PA 16066
USA
Ph: 724-772-7433
Fax: 724-772-7434
Tescan USA offers a full line of state-of-the-art, fully computer controlled scanning electron microscopes. The second generation VEGA-II series is a family of high-quality, tungsten filament SEMs designed for high vacuum or variable pressure operation. TESCAN is also proud to introduce the new MIRA family of high performance Schottky Field Emission SEMs, also available in high vacuum and variable pressure models. Both series incorporate Tescan's innovative 3 and 4-lens Wide Field OpticsTM designs, offering a variety of scanning and imaging modes that utilize Tescan's proprietary Intermediate Lens for beam aperture optimization. Both models are available with a comprehensive range of specimen chambers, stages, and accessories.
Thermo Fisher Scientific—834
5225 Verona Road
Madison, WI 53711
USA
Ph: 608-276-6100
Fax: 608-273-5046
Thermo Scientific, part of Thermo Fisher Scientific Inc., provides world-class solutions for analytical microscopists. See the industry standard X-ray microanalysis system, the NORAN System SIX, which offers complete analysis of the sample at the push of a button. Spectral imaging-based microanalysis eliminates user bias and sets the stage for phase-based results. Our Raman microscopy system utilizes automation and operational intelligence to make this information-rich technique easy to use. The K-Alpha monochromated XPS system makes surface analysis cost effective for the microanalysis laboratory.
Tietz Video and Image Processing Systems GmbH
Eremitenweg 1
Gauting, D-82131
Germany
Ph: +49-(0)89-8506567
Fax: .49-(0)89-8509488
TVIPS provides high-performance CCD cameras for TEM with resolutions from 1 to 64 million pixels. Customized solutions for all brands of TEMs in biology and materials science are available, e.g., tomography or digital video recording for in-situ experiments. TVIPS presents new features for the image processing platform EMMENU 4.0.
Tousimis—738
2211 Lewis Avenue
Rockville, MD 20851
USA
Ph: 301-881-2450
Fax: 301-881-5374
Tousimis manufactures CO2 Critical Point Dryers enabling delicate micro 3-D structural preservation. Applications are Cytoskeleton, Membrane, Cell and Tissues Organelles, Bio-MEMS, Gel, Polymer-Matrix drying, Aero-Gel and MEMS. Tousimis has global distribution sales and service support catering to your facility CPD needs. We also provide Ultra-Pure Fixatives and X-Ray Reference Standards. Visit us at booth #738.
TVIPS GmbH—224
Eremitenweg 1
D-82131 Gauting,
Germany
Ph: 49-89-8506567
Fax: 49-89-5806567
Varian, Inc.—728
Vacuum Technologies
121 Hartwell Avenue
Lexington, MA 02421
USA
Ph: 800-882-7426
Ph: 781-861-7200
Fax: 781-860-5437
Varian is a world leader in providing vacuum technology, offering unique expertise in applications, support, and system design to integrate its superior vacuum pumps, components and leak detectors into optimized vacuum solutions
Vibration Engineering Consultants—608
4555 Paul Sweet Road
Santa Cruz, CA 95065
USA
Ph: 831-465-9189
Fax: 831-401-2688
Vibration Engineering Consultants specializes in providing site surveys for equipment sensitive to magnetic field, vibration and acoustics. We are very experienced in identifying and solving problems with sensitive equipment. VEC sells magnetic field cancellation systems and our monitoring system provides eight channels of real time vibration, EMI, acoustic and temperature.
Well Diamond Wire Saws, Inc.—320
4708 S. Old Peachtree Rd
Ste 500-D
Norcross, GA 30071
USA
Ph: 770-582-9357
Fax: 770-582-9339
WITec Instruments Corp.—825
101 West Tomaras Avenue
Savoy, IL, 61874
USA
Ph: 217-351-9705
Fax: 217-352-6655
WITec is a manufacturer of modular, high resolution optical and scanning probe microscopy systems. WITec supplies the AlphaSNOM, using unique cantilever NSOM sensors, the confocal Raman microscope CRM200 for Raman imaging with highest resolution and sensitivity and the Mercury 100 AFM with the integrated Digital Pulsed Force Mode for materials research and nanotechnology.
XEI Scientific, Inc.—720
1755 East Bayshore Road
Suite 17
Redwood City, CA 94063
USA
Ph: 650-369-0133
Fax: 650-363-1659
XEI Scientific supplies the Evactron De-Contaminator to the Electron Microscope community. This highly effective tool removes organics and hydrocarbons from vacuum chambers and specimens to prevent contamination build-up. The Evactron De-Contaminator uses a small RF plasma to create oxygen radicals from air to oxidize organics and remove them as H2Oand CO vapors. It is effective and easy to install on SEMs and FIBs.
Xradia, Inc.—726
5052 Commercial Circle
Concord, CA 94520
USA
Ph: 925-288-1228
Fax: 925-288-0310