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Valence State Mapping of Iron Oxide Thin Film by Signal Processed ESI Series Energy-Loss Image

Published online by Cambridge University Press:  01 August 2005

K-F Chen ,
F-R Chen  and
J-J Kai
K-F Chen
Affiliation:
National Tsing-Hua University,Taiwan
F-R Chen
Affiliation:
National Tsing-Hua University,Taiwan
J-J Kai
Affiliation:
National Tsing-Hua University,Taiwan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 742 - 743
Copyright
© 2005 Microscopy Society of America