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The Use of EELS to Study the Urbach Edge of Silica

Published online by Cambridge University Press:  01 August 2005

S C Cheng ,
S L Schiefelbein ,
L Moore ,
M Pierson-Stull ,
S Sen  and
C Smith
S C Cheng
Affiliation:
Corning Incorporated, Corning, New York
S L Schiefelbein
Affiliation:
Corning Incorporated, Corning, New York
L Moore
Affiliation:
Corning Incorporated, Corning, New York
M Pierson-Stull
Affiliation:
Corning Incorporated, Corning, New York
S Sen
Affiliation:
Corning Incorporated, Corning, New York
C Smith
Affiliation:
Corning Incorporated, Corning, New York

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 730 - 731
Copyright
© 2005 Microscopy Society of America