Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-29T17:24:24.709Z Has data issue: false hasContentIssue false
  • English
  • Français

Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design

Published online by Cambridge University Press:  23 September 2015

Lewys Jones ,
Katherine E. MacArthur ,
Jolyon Aarons ,
Chris-Kriton Skylaris ,
Misbah Sarwar ,
Dogan Ozkaya  and
Peter D. Nellist
Lewys Jones
Affiliation:
Department of Materials, University of Oxford, Oxford UK.
Katherine E. MacArthur
Affiliation:
Department of Materials, University of Oxford, Oxford UK.
Jolyon Aarons
Affiliation:
School of Chemistry, University of Southampton, Southampton, UK.
Chris-Kriton Skylaris
Affiliation:
School of Chemistry, University of Southampton, Southampton, UK.
Misbah Sarwar
Affiliation:
Johnson Matthey, Reading, UK.
Dogan Ozkaya
Affiliation:
Johnson Matthey, Reading, UK.
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford UK.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2197 - 2198
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Lebeau, J. M. and Stemmer, S., Ultramicroscopy 108 (2008). p. 1653–1658.Google Scholar
[2] S. Van Aert et at Nature 470 (2011). p. 374–377.Google Scholar
[3] Jones, L. et al., Nano Lett. 14 (2014).p. 6336–6341.Google Scholar
[4] The authors acknowledge funding from EU FP7 grant 312483 (ESTEEM2), EPSRC grant EP/K040375/1 and Johnson Matthey, and S. VanAert and A. DeBacker for their useful discussions..Google Scholar