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Towards quantitative elemental mapping across interfaces by combining momentum-resolved STEM and EDX

Published online by Cambridge University Press:  30 July 2021

Mauricio Cattaneo ,
Katherine MacArthur ,
Juri Barthel  and
Knut Müller-Caspary
Mauricio Cattaneo
Affiliation:
Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons and the Peter Grünberg Institute Forschungszentrum Jülich, 52425 Jülich, Germany, United States
Katherine MacArthur
Affiliation:
Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons and the Peter Grünberg Institute Forschungszentrum Jülich, 52425 Jülich, Germany, Germany
Juri Barthel
Affiliation:
Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons and the Peter Grünberg Institute Forschungszentrum Jülich, 52425 Jülich, Germany, United States
Knut Müller-Caspary
Affiliation:
Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons and the Peter Grünberg Institute Forschungszentrum Jülich, 52425 Jülich, Germany, United States

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 604 - 607
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Lugg, N.R. et al. , Ultramic. 151 (2015)CrossRefGoogle Scholar
MacArthur, K.E. et al. , Ultramic. 182 (2017)CrossRefGoogle Scholar
Spurgeon, S.R. et al. , Microsc. & Microanal. 23 (2017)Google Scholar
Allen, L.J. et al. , Ultramic. 151 (2015)Google Scholar
Funding: Jülich Melbourne Postgraduate Academy (JUMPA, M.C.), DFG HE 7192/1-2 (K. M.). and Helmholtz Contract No. VH-NG-1317 (K. M-C.)Google Scholar