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TEM Characterization of a Mg2Si0.5Sn0.5 Solid Solution for High-Performance Thermoelectrics

Published online by Cambridge University Press:  23 September 2015

Minghui Song ,
Ji-Wei Liu ,
Masaki Takeguchi ,
Naohito Tsujii  and
Yukihiro Isoda
Minghui Song
Affiliation:
Transmission Electron Microscopy Station, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 3050047 Japan.
Ji-Wei Liu
Affiliation:
Transmission Electron Microscopy Station, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 3050047 Japan.
Masaki Takeguchi
Affiliation:
Transmission Electron Microscopy Station, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 3050047 Japan.
Naohito Tsujii
Affiliation:
Quantum Beam Unit, NIMS, 1-2-1 Sengen, Tsukuba, Ibaraki 3050047 Japan.
Yukihiro Isoda
Affiliation:
Battery Materials Unit, NIMS, 1-2-1 Sengen, Tsukuba, Ibaraki 3050047 Japan.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1809 - 1810
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Liu, W., et al, Chem. Mater. 23 (2011). p 5256.Google Scholar
[2] Zaitsev, V. K., et al, Phys. Rev. B 74 (2006). p 045207.Google Scholar
[3] Liu, J. W., et al, J. Electronic Mater 44 (2015). p 407.Google Scholar
[4] Thanks to Mitsuaki Nishio in NIMS for his help and discussion on the EPMA analysis.Google Scholar