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Super-X EDS Characterization of Chemical Segregation within a Superlattice Extrinsic Stacking Fault of a Ni- based Superalloy

Published online by Cambridge University Press:  23 September 2015

Robert E. A. Williams ,
Tim Smith ,
Bryan D. Esser ,
Nikolas Antolin ,
Wolfgang Windl ,
David W. McComb ,
Michael J. Mills  and
Hamish L. Fraser
Robert E. A. Williams
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA Center for Electron Microscopy and Analysis, The Ohio State University, 1305 Kinnear Road, Columbus, OH 43212, USA
Tim Smith
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA
Bryan D. Esser
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA
Nikolas Antolin
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA
Wolfgang Windl
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA
David W. McComb
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA Center for Electron Microscopy and Analysis, The Ohio State University, 1305 Kinnear Road, Columbus, OH 43212, USA
Michael J. Mills
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA
Hamish L. Fraser
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, 477 Watts Hall, 2041 College Road, Columbus, OH 43210, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 493 - 494
Copyright
Copyright © Microscopy Society of America 2015 

References

Refereneces:

[1] Viswanathan, G. B., et al.., Scripta Materialia 94 (2015). p 5–8.CrossRefGoogle Scholar
[2] Pickering, E. J., et al.., Acta Materialia 60(6-7) (2012) 2757–2769.CrossRefGoogle Scholar