Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-23T19:07:10.119Z Has data issue: false hasContentIssue false

The Stability of Sapphire in the Presence of Water: an Environmental TEM Study

Published online by Cambridge University Press:  04 August 2017

Jennifer Carpena-Núñez
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, Ohio45433 National Research Council, Washington, DC 20001
Dmitri Zakharov
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York, 11973
Ahmad Ehteshamul Islam
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, Ohio45433 UES, Inc., Dayton, Ohio45431
Gordon Sargent
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, Ohio45433 UES, Inc., Dayton, Ohio45431
Eric A. Stach
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York, 11973
Benji Maruyama
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, Ohio45433

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Lodziana, L. Z., Norskov, J. K. & Stoltze, P. J. Chem. Phys. 118 2003 11179.Google Scholar
[2] Moroño, A., Hodgson, E. R. & González de Vicente, S. M. J. Nucl. Mater. 386–388 2009). p. 10021005.Google Scholar
[3] Pells, G. P. & Phillips, D. C. J. Nucl. Mater. 80 1979). p. 215222.CrossRefGoogle Scholar
[4] Mochel, M. E., Humphreys, C. J., Eades, J. A., Mochel, J. M. & Petford, A. M. Appl. Phys. Lett. 42 1983). p. 392.Google Scholar
[5] Mochel, M. E., Eades, J. A., Metzger, M., Meyer, J. I. & Mochel, J. M. Appl. Phys. Lett. 44 1984). p. 502504.Google Scholar
[6] Caer, S. L. Water 3 2011). p. 235253.Google Scholar
[7] Knotek, M. L & Feibelman, P. J. Phys. Rev. Lett. 40 1978). p. 964.Google Scholar
[8] Royall, C. P., Thiel, B.L. & Donald, A. M. J. Microscopy 204 2001). p. 185195.Google Scholar
[9] Wirth, R. Phys. Chem. Minerals 24 1997). p. 561568.Google Scholar