A Review of Field Electron Source Use in Electron Microscopes

L W Swanson; G A Schwind

doi:10.1017/S1431927605503854

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Crossref Citations

This article has been cited by the following publications. This list is generated based on data provided by Crossref.

Forbes, Richard G. 2009. Use of Millikan–Lauritsen plots, rather than Fowler–Nordheim plots, to analyze field emission current-voltage data. Journal of Applied Physics, Vol. 105, Issue. 11,

Cabrera, H. Zanin, D. A. De Pietro, L. G. Michaels, Th. Thalmann, P. Ramsperger, U. Vindigni, A. Pescia, D. Kyritsakis, A. Xanthakis, J. P. Li, Fuxiang and Abanov, Ar. 2013. Scale invariance of a diodelike tunnel junction. Physical Review B, Vol. 87, Issue. 11,

Di Bartolomeo, Antonio Passacantando, Maurizio Niu, Gang Schlykow, Viktoria Lupina, Grzegorz Giubileo, Filippo and Schroeder, Thomas 2016. Observation of field emission from GeSn nanoparticles epitaxially grown on silicon nanopillar arrays. Nanotechnology, Vol. 27, Issue. 48, p. 485707.

Giubileo, Filippo Di Bartolomeo, Antonio Iemmo, Laura Luongo, Giuseppe and Urban, Francesca 2018. Field Emission from Carbon Nanostructures. Applied Sciences, Vol. 8, Issue. 4, p. 526.

Zhou, Yang and Zhang, Peng 2020. Theory of field emission from dielectric coated surfaces. Physical Review Research, Vol. 2, Issue. 4,

Zhou, Yang Ahsan, Ragib Chae, Hyun Uk Kapadia, Rehan and Zhang, Peng 2023. Theoretical Analysis of Resonant Tunneling Enhanced Field Emission. Physical Review Applied, Vol. 20, Issue. 1,

Nonappa 2024. Seeing the Supracolloidal Assemblies in 3D: Unraveling High-Resolution Structures Using Electron Tomography. ACS Materials Au, Vol. 4, Issue. 3, p. 238.

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A Review of Field Electron Source Use in Electron Microscopes

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