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Rapid Tilt-series Methods: The Future of Cryo-ET

Published online by Cambridge University Press:  30 July 2020

Georges Chreifi ,
Songye Chen  and
Grant Jensen
Georges Chreifi
Affiliation:
California Institute of Technology, Pasadena, California, United States
Songye Chen
Affiliation:
California Institute of Technology, Pasadena, California, United States
Grant Jensen
Affiliation:
California Institute of Technology, Pasadena, California, United States

Abstract

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Type
The Promise of Cryo-Electron Tomography
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 3002 - 3003
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Copyright
Copyright © Microscopy Society of America 2020

References

Chreifi, G., Chen, S., Metskas, L. A., Kaplan, M., and Jensen, G. J. (2019) Rapid tilt-series acquisition for electron cryotomography. Journal of Structural Biology 205, 163–169.10.1016/j.jsb.2018.12.008CrossRefGoogle ScholarPubMed
Mastronarde, D. N. (2003) SerialEM: A Program for Automated Tilt Series Acquisition on Tecnai Microscopes Using Prediction of Specimen Position. Microscopy and Microanalysis 9, 1182–1183.10.1017/S1431927603445911CrossRefGoogle Scholar
Eisenstein, F., Danev, R., and Pilhofer, M. (2019) Improved applicability and robustness of fast cryo-electron tomography data acquisition. Journal of Structural Biology 208, 107–114.10.1016/j.jsb.2019.08.006CrossRefGoogle ScholarPubMed