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Rapid EDS Element Images for Image Analysis – A New Application of the XFlash® X-ray Detector Technology at the Scanning Electron Microscope

Published online by Cambridge University Press:  24 July 2003

Gabriele Mäurer ,
Gert Kommichau  and
Thomas Schülein
Gabriele Mäurer
Affiliation:
RÖNTEC GmbH, Schwarzschildstr. 12, D-12489 Berlin, Germany
Gert Kommichau
Affiliation:
RÖNTEC GmbH, Schwarzschildstr. 12, D-12489 Berlin, Germany
Thomas Schülein
Affiliation:
RÖNTEC GmbH, Schwarzschildstr. 12, D-12489 Berlin, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1044 - 1045
Copyright
Copyright © Microscopy Society of America 2003