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Quantitative Determination of Chemical Composition of Multinary III/V Semiconductors With Sublattice Resolution Using Aberration Corrected HAADF-STEM

Published online by Cambridge University Press:  23 September 2015

Andreas Beyer ,
Nikolai Knaub  and
Kerstin Volz
Andreas Beyer
Affiliation:
Philipps-Universitat Marburg, Faculty of Physics and Materials Science Center, 35032 Marburg, Germany
Nikolai Knaub
Affiliation:
Philipps-Universitat Marburg, Faculty of Physics and Materials Science Center, 35032 Marburg, Germany
Kerstin Volz
Affiliation:
Philipps-Universitat Marburg, Faculty of Physics and Materials Science Center, 35032 Marburg, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2081 - 2082
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Kunert, B., Volz, K., Koch, J. & Stolz, W., Appl. Phys. Lett 88 (2006). p 182108.Google Scholar
[2] Grieb, T., et al., Microsc. Microanal 20 (2014). pp 1740–1752.Google Scholar
[3] Rosenauer, A. & Schowalter, M., Microsc. Semicond. Mater 2007(120 (2008). pp 170–172.Google Scholar
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[5] The authors acknowledge funding from the DFG in the framework of GRK 1782 (functionalisation of semiconductors).Google Scholar