Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-23T11:57:39.438Z Has data issue: false hasContentIssue false
  • English
  • Français

Performance of Monochromized and Aberration-Corrected TEMs

Published online by Cambridge University Press:  01 August 2004

Gerd Benner ,
Erik Essers ,
Marko Matijevic ,
Alexander Orchowski ,
Peter Schlossmacher ,
Alexander Thesen ,
Maximilian Haider  and
Peter Hartel
Gerd Benner
Affiliation:
LEO Electron Microscopy Group, Oberkochen, Germany
Erik Essers
Affiliation:
LEO Electron Microscopy Group, Oberkochen, Germany
Marko Matijevic
Affiliation:
LEO Electron Microscopy Group, Oberkochen, Germany
Alexander Orchowski
Affiliation:
LEO Electron Microscopy Group, Oberkochen, Germany
Peter Schlossmacher
Affiliation:
LEO Electron Microscopy Group, Oberkochen, Germany
Alexander Thesen
Affiliation:
LEO Electron Microscopy Group, Oberkochen, Germany
Maximilian Haider
Affiliation:
CEOS, Heidelberg, Germany
Peter Hartel
Affiliation:
CEOS, Heidelberg, Germany
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 108 - 109
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)