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On-axis Transmission Kikuchi Diffraction for Orientation Mapping of Nanocrystalline Materials in the SEM

Published online by Cambridge University Press:  04 August 2017

E. Brodu
Affiliation:
Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux (LEM3), UMR CNRS 7239, Université de Lorraine, Metz, France Laboratory of Excellence on Design of Alloy Metals for low-MAss Structures (DAMAS), University of Lorraine, Metz, France
E. Bouzy
Affiliation:
Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux (LEM3), UMR CNRS 7239, Université de Lorraine, Metz, France Laboratory of Excellence on Design of Alloy Metals for low-MAss Structures (DAMAS), University of Lorraine, Metz, France
J-J. Fundenberger
Affiliation:
Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux (LEM3), UMR CNRS 7239, Université de Lorraine, Metz, France Laboratory of Excellence on Design of Alloy Metals for low-MAss Structures (DAMAS), University of Lorraine, Metz, France

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Steinmetz, DR & Zaefferer, S Materials Science and Technology 26 2010). p. 640.Google Scholar
[2] Keller, R & Geiss, RH Journal of Microscopy 245 2012). p. 245.CrossRefGoogle Scholar
[3] van Bremen, R, et al, Ultramicroscopy 160 2016). p. 256.Google Scholar
[4] Wang, YZ, et al, Journal of Microscopy 264 2016). p. 34.Google Scholar
[5] Trimby, W Ultramicroscopy 12 2012). p. 16.Google Scholar
[6] Fundenberger, J-J, et al, Ultramicroscopy 161 2016). p. 17.CrossRefGoogle Scholar
[7] Yuan, H, et al Journal of microscopy - Accepted 2016.Google Scholar
[8] Beausir, B & Fundenberger, J-J ATOM - Analysis Tools for Orientation Maps, http://atom-software.eu/.Google Scholar