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On the Multiple Event Detection in Atom Probe Tomography

Published online by Cambridge University Press:  04 August 2017

Zirong Peng ,
Baptiste Gault ,
Dierk Raabe ,
Michael W Ashton ,
Susan B Sinnott ,
Pyuck-Pa Choi  and
Yujiao Li
Zirong Peng
Affiliation:
Department of Microstructure Physics and Alloy Design, Max-Planck-Institut fiir Eisenforschung GmbH, Max-Planck-StraBe 1, Dusseldorf, Germany
Baptiste Gault
Affiliation:
Department of Microstructure Physics and Alloy Design, Max-Planck-Institut fiir Eisenforschung GmbH, Max-Planck-StraBe 1, Dusseldorf, Germany
Dierk Raabe
Affiliation:
Department of Microstructure Physics and Alloy Design, Max-Planck-Institut fiir Eisenforschung GmbH, Max-Planck-StraBe 1, Dusseldorf, Germany
Michael W Ashton
Affiliation:
Department of Materials science and Engineering, University of Florida, Gainesville, FloridaUSA
Susan B Sinnott
Affiliation:
Materials Science and Engineering, Pennsylvania State University, State College, Pennsylvania, USA
Pyuck-Pa Choi
Affiliation:
Department of Microstructure Physics and Alloy Design, Max-Planck-Institut fiir Eisenforschung GmbH, Max-Planck-StraBe 1, Dusseldorf, Germany Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon, Republic of Korea
Yujiao Li
Affiliation:
Center for Interface-Dominated High Performance Materials, Ruhr-Universitat Bochum, Bochum, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 618 - 619
Copyright
© Microscopy Society of America 2017 

References

[1] Gault, B., et al, Atom Probe Microscopy. Springer New York 2012.Google Scholar
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[4] Gault, B., et al, New J. Phys 18 2016). p. 33031.CrossRefGoogle Scholar
[5] Da Costa, G., et al, Rev. Sci. Instrum 83 2012). p. 123709.Google Scholar
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[8] Peng, Z., et al, Microsc. Microanal 2017). p. 1.Google Scholar