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Novel thin film lift-off process for in situ TEM tensile characterization

Published online by Cambridge University Press:  30 July 2021

Krishna Kanth Neelisetty ,
Shyam Kumar CN ,
Ankush Kashiwar ,
Torsten Scherer ,
VS Kiran Chakravadhanula  and
Christian Kuebel
Krishna Kanth Neelisetty
Affiliation:
Thermofisher Scientific, Brno, Jihomoravsky kraj, Czech Republic
Shyam Kumar CN
Affiliation:
Institute of Nanotechnology, Karlsruhe Institute of Technology, United States
Ankush Kashiwar
Affiliation:
Institute of Nanotechnology, Karlsruhe Institute of Technology, Belgium
Torsten Scherer
Affiliation:
Institute of Nanotechnology, Karlsruhe Institute of Technology, Baden-Wurttemberg, Germany
VS Kiran Chakravadhanula
Affiliation:
Institute of Nanotechnology, Karlsruhe Institute of Technology, Telangana, India
Christian Kuebel
Affiliation:
Karlsruhe Institute of Technology, Eggenstein-Leopoldshafen, Baden-Wurttemberg, Germany

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 216 - 217
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Kumar, Shyam, N, C.. et al. (2017) ‘Understanding the graphitization and growth of free-standing nanocrystalline graphene using in situ transmission electron microscopy’, Nanoscale, 9(35), pp. 12835–12842.CrossRefGoogle Scholar
Kumar, Shyam, N, C.. et al. (2019) ‘Nanocrystalline graphene at high temperatures: insight into nanoscale processes’, Nanoscale Advances, 1(7), pp. 2485–2494.CrossRefGoogle ScholarPubMed