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Multislice electron ptychography enables lattice vibration-limited resolution and linear phase-contrast imaging in thick samples

Published online by Cambridge University Press:  30 July 2021

Zhen Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, New York, United States
Yi Jiang
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, IL60439, USA, United States
Yu-Tsun Shao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithac, New York, United States
Megan Holtz
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA, United States
Michal Odstrcil
Affiliation:
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland, Switzerland
Manuel Guizar-Sicairos
Affiliation:
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland, Switzerland
Isabelle Hanke
Affiliation:
Leibniz-Institut für Kristallzüchtung, Max-Born-Str. 2, 12489 Berlin, Germany, Berlin, Germany
Steffen Ganschow
Affiliation:
Leibniz-Institut für Kristallzüchtung, Max-Born-Str. 2, 12489 Berlin, Germany, Berlin, Germany
Darrell Schlom
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA, Ithaca, New York, United States
David Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithaca, New York, United States

Abstract

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Type
Diffraction Imaging Across Disciplines
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Research supported by US NSF (grants DMR-1539918 and DMR-1719875).Google Scholar