Microscale Metallography Using Focused Ion Beam

Jonathan C. Trenkle

doi:10.1017/S1431927614010976

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Microscale Metallography Using Focused Ion Beam

Published online by Cambridge University Press: 27 August 2014

Jonathan C. Trenkle

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Jonathan C. Trenkle*: Affiliation:
Exponent Inc., Natick, MA, USA

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Information: Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1848 - 1849

DOI: https://doi.org/10.1017/S1431927614010976 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2014

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Microscale Metallography Using Focused Ion Beam

Volume 20, Supplement S3
Jonathan C. Trenkle ^(a1)
DOI: https://doi.org/10.1017/S1431927614010976

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Microscale Metallography Using Focused Ion Beam

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