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A Metrology Approach to Uncertainty in Quantitative EDS Analyses

Published online by Cambridge University Press:  01 August 2003

S.N. Prins ,
L.H. Adlem  and
M.E. Lee
S.N. Prins
Affiliation:
CSIR-National Metrology Laboratory, PO Box 395, Pretoria, 0001, South Afric
L.H. Adlem
Affiliation:
CSIR-National Metrology Laboratory, PO Box 395, Pretoria, 0001, South Afric
M.E. Lee
Affiliation:
CSIR-National Metrology Laboratory, PO Box 395, Pretoria, 0001, South Afric

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 716 - 717
Copyright
Copyright © Microscopy Society of America 2003