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Maximizing the Information Content in Electron Microscopy Images

Published online by Cambridge University Press:  03 December 2021

Raphael Marchand  and
Thomas Juffmann
Raphael Marchand
Affiliation:
University of Vienna, Faculty of Physics, VCQ, A-1090Vienna, Austria. University of Vienna, Max Perutz Laboratories, Department of Structural and Computational Biology, A-1030Vienna, Austria.
Thomas Juffmann
Affiliation:
University of Vienna, Faculty of Physics, VCQ, A-1090Vienna, Austria. University of Vienna, Max Perutz Laboratories, Department of Structural and Computational Biology, A-1030Vienna, Austria.

Abstract

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Type
TEM Innovations to Study Materials Properties In Situ
Information
Microscopy and Microanalysis , Volume 27 , Supplement S2: Proceedings of CISCEM 2021 - the 5th Conference on In-Situ and Correlative Electron Microscopy , November 2021 , pp. 63 - 64
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

References:

Glaeser, RM, Nat. Meth. 13 (2016), p. 28.10.1038/nmeth.3695CrossRefGoogle Scholar
Bouchet, D et al. , Physical Review Applied 15 (2021), p. 024047.10.1103/PhysRevApplied.15.024047CrossRefGoogle Scholar
Koppell, S and Kasevich, M, Optica 8 (2021), p. 493.10.1364/OPTICA.412129CrossRefGoogle Scholar
Juffmann, T et al. , Scientific Reports 7 (2017), p. 1699.10.1038/s41598-017-01841-xCrossRefGoogle Scholar
Koppell, SA et al. , Ultramicroscopy 207 (2019), p. 112834.10.1016/j.ultramic.2019.112834CrossRefGoogle Scholar
Marchand, R et al. , Physical Review Applied 16 (2021), p. 12102.10.1103/PhysRevApplied.16.014008CrossRefGoogle Scholar
Geelen, D et al. , Review Letters 123 (2019).10.1103/PhysRevLett.123.086802CrossRefGoogle Scholar
Hohenester, U and Trügler, A, Computer Physics Communications 183 (2012), p. 370.10.1016/j.cpc.2011.09.009CrossRefGoogle Scholar