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Materials FA Investigation of a Semiconductor Laser Diode Package with SEM FIB EDS and correlation with the Feedback Oxidation Loop of FA literature.

Published online by Cambridge University Press:  01 August 2005

C Podpora ,
M McElhinney  and
R Walker
C Podpora
Affiliation:
Lasertel Inc.
M McElhinney
Affiliation:
Lasertel Inc.
R Walker
Affiliation:
Lasertel Inc.

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1606 - 1607
Copyright
© 2005 Microscopy Society of America