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Lossless Deep Image Compression at the Edge for 3D Electron Microscopy

Published online by Cambridge University Press:  30 July 2021

Jacob Hinkle ,
Todd Young ,
Inzamam Haque ,
Clay Reid  and
Olga Ovchinnikova
Jacob Hinkle
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Todd Young
Affiliation:
Oak Ridge National Laboratory, United States
Inzamam Haque
Affiliation:
University of Tennnessee, United States
Clay Reid
Affiliation:
Allen Institute for Brain Science, United States
Olga Ovchinnikova
Affiliation:
Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States

Abstract

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Type
Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 472 - 473
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Dorkenwald, et al. bioRxiv 2019.12.29.890319.Google Scholar
Schneider-Mizell, et al. bioRxiv 2020.03.31.018952v1.Google Scholar