Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
2022.
Principles of Electron Optics, Volume 3.
p.
1869.
Li, Guanxing
Zhang, Hui
and
Han, Yu
2022.
4D-STEM Ptychography for Electron-Beam-Sensitive Materials.
ACS Central Science,
Vol. 8,
Issue. 12,
p.
1579.
Zhang, Hui
Li, Xiaopeng
Liu, Jiang
Lan, Ya‐Qian
and
Han, Yu
2024.
Advancing Single‐Particle Analysis in Synthetic Chemical Systems: A Forward‐Looking Discussion.
Advanced Materials,