Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Kratochvil, Bradley E.
Lixin Dong
and
Nelson, Bradley J.
2009.
Real-time Rigid-body Visual Tracking in a Scanning Electron Microscope.
The International Journal of Robotics Research,
Vol. 28,
Issue. 4,
p.
498.
Lee, Wonsuk
2011.
Measurement of critical dimension in scanning electron microscope mask images.
Journal of Micro/Nanolithography, MEMS, and MOEMS,
Vol. 10,
Issue. 2,
p.
023003.
Panchal, Suresh
Datar, Suwarna
and
Gopinathan, Unnikrishnan
2022.
Performance enhancement of a scanning electron microscope using a deep convolutional neural network.
Measurement Science and Technology,
Vol. 33,
Issue. 6,
p.
065403.
Xie, Yutong
Davaji, Benyamin
Doerschuk, Peter C.
Lal, Amit
Chakarov, Ivan
Wen, Sandy
Hargrove, Michael
and
Fried, David
2023.
BinDev: a Metric of Geometric Accuracy for Plasma-etch 3D Modeling Using Computer Vision : YM: Yield Methodologies.
p.
1.
Kuchar, Daniel
Gogola, Peter
Gabalcova, Zuzana
Nemethova, Andrea
and
Nemeth, Martin
2023.
Segmentation and Classification of Zn-Al-Mg-Sn SEM BSE Microstructure.
Applied Sciences,
Vol. 13,
Issue. 2,
p.
1045.
Bals, Jonas
and
Epple, Matthias
2023.
Artificial Scanning Electron Microscopy Images Created by Generative Adversarial Networks from Simulated Particle Assemblies.
Advanced Intelligent Systems,
Vol. 5,
Issue. 7,
Mohammad Motiur Rahman, Sheikh Shah
Salomon, Michel
and
DembÉlÉ, Sounkalo
2023.
Noise Analysis to Guide Denoising of Scanning Electron Microscopy Images.
p.
1559.
Xiao, Wei
Zhao, Fazhan
Ma, Hongtu
Zhao, Kun
and
Li, Qing
2024.
Denoising model for scanning electron microscope images of integrated circuits based on denoising diffusion probabilistic models.
Journal of Micro/Nanopatterning, Materials, and Metrology,
Vol. 23,
Issue. 03,
Roldán, Diego
Redenbach, Claudia
Schladitz, Katja
Kübel, Christian
and
Schlabach, Sabine
2024.
Image quality evaluation for FIB‐SEM images.
Journal of Microscopy,
Vol. 293,
Issue. 2,
p.
98.