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Increased Sample Yield and Achievable Imaging Resolutions Through Thin Film Transfer Technique
Published online by Cambridge University Press: 01 August 2018
Abstract
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- Abstract
- Information
- Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1630 - 1631
- Copyright
- © Microscopy Society of America 2018
References
[3] The authors would like to thank Intel, NSF, and the Oregon Metals Initiative.Google Scholar
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