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Inclusion Characterization of Lanthana-Doped Molybdenum Wire

Published online by Cambridge University Press:  19 July 2003

L.E. Iorio ,
B.P. Bewlay  and
M. Larsen
L.E. Iorio
Affiliation:
General Electric Global Research Center, P.O. Box 8, Schenectady, New York 12301
B.P. Bewlay
Affiliation:
General Electric Global Research Center, P.O. Box 8, Schenectady, New York 12301
M. Larsen
Affiliation:
General Electric Global Research Center, P.O. Box 8, Schenectady, New York 12301

Abstract

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Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 600 - 601
Copyright
Copyright © Microscopy Society of America 2003