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In Situ TEM Characterization of Nanostructured Dielectrics

Published online by Cambridge University Press:  23 September 2015

Ming-Siao Hsiao ,
Yifei Yuan ,
Christopher Grabowski ,
Anmin Nie ,
Reza Shabazian-Yassar  and
Lawrence F. Drummy
Ming-Siao Hsiao
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratories, WPAFB, OH 45433 UES, Inc., Dayton, OH 45432
Yifei Yuan
Affiliation:
Department of Mechanical Engineering, Michigan Technological University, Houghton, MI 49931 Physics Department, University of Illinois at Chicago, Chicago, IL 60607
Christopher Grabowski
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratories, WPAFB, OH 45433 UES, Inc., Dayton, OH 45432
Anmin Nie
Affiliation:
Department of Mechanical Engineering, Michigan Technological University, Houghton, MI 49931 Physics Department, University of Illinois at Chicago, Chicago, IL 60607
Reza Shabazian-Yassar
Affiliation:
Department of Mechanical Engineering, Michigan Technological University, Houghton, MI 49931 Physics Department, University of Illinois at Chicago, Chicago, IL 60607
Lawrence F. Drummy
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratories, WPAFB, OH 45433

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1813 - 1814
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Whittingham, M. S., MRS Bull vol. 33 (2008). p 411.CrossRefGoogle Scholar
[2] Barber, P., Loye, H.-C. Z., et al, Materials vol. 2 (2009). p 1697.Google Scholar
[3] Grabowski, C. A., Vaia, R. A., et al, ACS Appl. Mater. Interfaces vol. 6 ( 2014). p 21500.Google Scholar
[4] Hsiao, M.-S., Drummy, L. F., et al In preparation.Google Scholar
[5] The authors acknowledge support from the Air Force Research Laboratory.Google Scholar