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In Situ Materials Characterization of 2-Dim Materials at High Energy and Spatial Resolution

Published online by Cambridge University Press:  01 August 2018

Xuan Hu ,
Jacob R. Jokisaari ,
Liang Hong  and
Robert F. Klie
Xuan Hu
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL.
Jacob R. Jokisaari
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL.
Liang Hong
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL.
Robert F. Klie
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 428 - 429
Copyright
© Microscopy Society of America 2018 

References

[1] Standley, B., et al, Nano Lett 8 2008) p. 3345.Google Scholar
[2] Wang, C., et al, Appl. Mat. 26 2014) p. 3410.Google Scholar
[3] Hu, X., et al, Phys. Rev. Lett 120(5 2018 055902.Google Scholar
[4] Wang, C., et al, Adv. Mat 28(35 2016) p. 7716.Google Scholar
[5] This work was in part supported by the National Science Foundation (EFMA-1542864 (EFRI)).Google Scholar